throbber
Trials@uspto.gov
`Tel: 571-272-7822
`
`
`
`
`Paper 29
`Entered: May 4, 2015
`
`UNITED STATES PATENT AND TRADEMARK OFFICE
`_______________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`_______________
`
`TOSHIBA CORPORATION, TOSHIBA AMERICA, INC.,
`TOSHIBA AMERICA ELECTRONIC COMPONENTS, INC.,
`and TOSHIBA AMERICA INFORMATION SYSTEMS, INC.,
`Petitioner,
`
`v.
`
`INTELLECTUAL VENTURES I LLC,
`Patent Owner.
`_______________
`
`Case IPR2014-00113
`Patent 6,058,045
`_______________
`
`
`Before KEVIN F. TURNER, TREVOR M. JEFFERSON,
`and DAVID C. McKONE, Administrative Patent Judges.
`
`JEFFERSON, Administrative Patent Judge.
`
`
`
`
`
`FINAL WRITTEN DECISION
`35 U.S.C. § 318(a) and 37 C.F.R. § 42.73
`
`
`

`

`IPR2014-00113
`Patent 6,058,045
`
`
`I. INTRODUCTION
`
`A. Background
`
`Toshiba Corporation, Toshiba America, Inc., Toshiba America
`
`Electronic Components, Inc., and Toshiba America Information Systems,
`
`Inc. (collectively, “Petitioner”) filed a Petition (Paper 1, “Pet.”) to institute
`
`an inter partes review of claims 1 and 4 of U.S. Patent No. 6,058,045
`
`(Ex. 1001, “the ’045 patent”). See 35 U.S.C. § 311. Intellectual Ventures I
`
`LLC (“Patent Owner”) filed a Preliminary Response (Paper 10, “Prelim.
`
`Resp.”). Pursuant to 35 U.S.C. § 314, in our Decision to Institute (Paper 13,
`
`“Dec.”) we instituted this proceeding as to claims 1 and 4 of the ’045 patent.
`
`Patent Owner filed a Patent Owner Response (Paper 20, “PO Resp.”)
`
`and Petitioner filed a Reply to the Patent Owner Response (Paper 21,
`
`“Reply”). An oral hearing in this matter was held on November 6, 2014
`
`(Paper 28, “Tr.”).
`
`We have jurisdiction under 35 U.S.C. § 6(c). This is a final written
`
`decision under 35 U.S.C. § 318(a) and 37 C.F.R. § 42.73 as to the
`
`patentability of the challenged claims. For the reasons that follow, Petitioner
`
`has demonstrated by a preponderance of the evidence that claims 1 and 4 of
`
`the ’045 patent are unpatentable.
`
`B. Related Matters
`
`Patent Owner has sued Petitioner for infringement of the ’045 patent
`
`in Intellectual Ventures I LLC v. Toshiba Corp., No. 1:13-cv-00453 (D.
`
`Del.), filed on March 20, 2013. Pet. 1; Paper 7 (Patent Owner’s Mandatory
`
` 2
`
`
`
`Notices).
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`

`

`IPR2014-00113
`Patent 6,058,045
`
`
`C. The ’045 Patent
`
`The ’045 patent, titled “Serial Flash Memory,” issued on May 2,
`
`2000, and claims the benefit of a provisional application dated September 9,
`
`1996. Ex. 1001, at [45], [60], [62]. The ’045 patent discloses a “scaleable
`
`flash memory cell structure and method of manufacture that improves data
`
`retention, increases capacitive coupling and speed of operation, and
`
`improves reliability.” Id. at 2:39–42. “The flash cell of the [’045 patent]
`
`permits implementation of arrays of flash memory cells that allow the
`
`designer to program and/or erase individual bytes of memory as well as
`
`blocks of memory.” Id. at 2:44–46. Figure 4 of the ’045 patent, shown
`
`below, provides the exemplary memory array circuit disclosed.
`
`
`
`Figure 4 depicts “a circuit schematic for an exemplary memory array made
`
`of flash cells.” Id. at 3:25–26. The disclosed memory array 400 in Figure 4
`
`includes columns of serially connected flash memory cells located at the
`
`intersection of bit lines (BL0–BL15) and word lines (WL0–WL15). Id. at
`
`6:22–28. Bit select control line (BSL) controls gate terminals of bit select
`
` 3
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`IPR2014-00113
`Patent 6,058,045
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`transistors 404, which couple bit lines to memory cells. Id. at 6:30–31.
`
`Source select control line (SSL) controls gate terminals for source select
`
`transistors 406, which couple ground to memory cells. Id. at 6:31–32.
`
`Table 1 of the’045 patent, reproduced below, provides a biasing
`
`scheme that discloses voltages that are applied to lines of the array to
`
`perform program, read, or erase operations for selected or unselected
`
`portions of the array.
`
`
`
`Id. at 6:37–45. Table 1 provides an example of a biasing scheme for an
`
`individual cell, showing voltages applied to various control lines (i.e., Vcc,
`
`Vss, etc.), and the desired function (erase, program, or read) for the selected
`
`
`
`or unselected portions of the array. Id. at 6:48–56.
`
`D. Challenged Claims
`
`
`
`Challenged claims 1 and 4 are reproduced below:
`
`1. An array of flash memory cells comprising:
`
`a plurality of columns of serially connected flash
`memory cells, each memory cell having a
`gate terminal;
`
`a plurality of bit lines respectively coupled to drain
`side of said plurality of columns of memory
`cells via a respective plurality of bit line
`select transistors, said plurality of bit line
`
` 4
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`

`IPR2014-00113
`Patent 6,058,045
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`terminals
`transistors having gate
`select
`coupled to a bit line select control line;
`
`a plurality of word lines, each one coupling to a
`gate terminal of one memory cell in each of
`said plurality of columns to from rows of
`memory cells with common gate terminals;
`and
`
`a plurality of source select transistors respectively
`coupling a source side of said plurality of
`columns of memory cells to a logic low
`voltage, and having gate terminals coupled
`to a source select control line,
`
`wherein, during programming:
`
`a logic high voltage is applied to said bit line select
`control line to turn on bit line select
`transistors,
`
`a logic low voltage is applied to source select
`control
`line
`to
`turn off source select
`transistors;
`
`a logic low voltage is applied to a selected bit line
`while a logic high voltage is applied to
`unselected bit lines, and
`
`a logic high voltage is applied to unselected word
`lines, while a boosted positive voltage is
`applied to a selected word line.
`
`
`
`4. A method of operating a flash memory device
`wherein programming memory cells
`is
`accomplished by the steps of:
`
`applying a logic high voltage to a bit line select
`control line to turn on bit line select
`transistors,
`
` 5
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`IPR2014-00113
`Patent 6,058,045
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`applying a logic low voltage to a source select
`control
`line
`to
`turn off source select
`transistors;
`
`applying a logic low voltage to a selected bit line
`while a logic high voltage is applied to
`unselected bit lines, and
`
`applying a logic high voltage to unselected word
`lines, while a boosted positive voltage is
`applied to a selected word line.
`
`E. The Asserted Ground
`
`Petitioner contends that the challenged claims are unpatentable based
`
`on the following ground, upon which we instituted (Dec. 14; Pet. 13–29):
`
`Basis
`
`Claims Challenged
`
`35 U.S.C. § 102(b)
`
`1 and 4
`
`Reference
`Nakai1
`
`
`II. ANALYSIS
`
`A. Claim Construction
`
`The Board interprets claims of an unexpired patent using the broadest
`
`reasonable construction in light of the specification of the patent in which
`
`they appear. See 37 C.F.R. § 42.100(b). Claim terms generally are given
`
`their ordinary and customary meaning, as would be understood by one of
`
`ordinary skill in the art in the context of the entire disclosure. See In re
`
`Translogic Tech., Inc., 504 F.3d 1249, 1257 (Fed. Cir. 2007).
`
`
`1 U.S. Patent No. 5,297,029, issued on Mar. 22, 1994 (filed on Dec. 18,
`1992) (Ex. 1005, “Nakai”).
`
` 6
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`IPR2014-00113
`Patent 6,058,045
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`1. “logic high voltage” (claims 1 and 4)
`
`Claims 1 and 4 recite “logic high voltage” as a claim limitation. We
`
`preliminarily construed “logic high voltage” as a positive voltage higher
`
`than logic low voltage, such as Vcc. Dec. 8.
`
`Patent Owner contends that Petitioner’s proposed construction, which
`
`we agreed with for purposes of the Decision to Institute, is incorrect.
`
`PO Resp. 10–12. Patent Owner contends that, properly construed, “[o]ne of
`
`ordinary skill in the art would understand that a ‘logic high voltage’ would
`
`be less than or equal to the nominal value of the memory array’s power
`
`supply, or what one of skill in the art would recognize as ‘Vcc.’” PO Resp.
`
`12 (citing Declaration of Louis J. Morales, Ex. 2001 ¶¶ 25–33, 39;
`
`Declaration of John E. Berg, Ex. 2002 ¶¶ 27–32.) Thus, Patent Owner
`
`argues, “a proper construction of ‘logic high voltage’ is ‘a positive voltage
`
`higher than logic low voltage and less than or equal to the nominal value
`
`for Vcc.’” PO Resp. 12.
`
`Patent Owner argues that Petitioner’s support for its proposed
`
`construction should be given little or no weight because Petitioner’s expert
`
`lacks NAND flash memory experience and is not a person of ordinary skill
`
`in the art. PO Resp. 10. In addition, Patent Owner contends that Petitioner’s
`
`proposed constructions, which define the terms relative to each other—
`
`“logic low voltage” < “logic high voltage” < “boosted positive voltage”—
`
`result in imprecise terms without clear demarcations between the various
`
`claimed voltages. PO Resp. 10–11 (citing Ex. 2002 ¶¶ 27–30).
`
`Patent Owner supports its proposed construction by arguing that it
`
`was common in the art for “the memory devices disclosed in the ’045 patent
`
`(and also in Nakai) [to] have a nominal power supply that is referred to as
`
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`IPR2014-00113
`Patent 6,058,045
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`‘Vcc.’” PO Resp. 13 (citing Ex. 2001 ¶¶ 24–33, 39; Ex. 2002 ¶¶ 21–23).
`
`Patent Owner argues that because a boosted positive voltage is higher than
`
`nominal power supply voltage Vcc, the nominal power supply voltage
`
`provides “the only principled and precise dividing line between a logic high
`
`voltage, and the higher voltages that are boosted over Vcc.” Id. The only
`
`support Patent Owner cites from the ’045 patent is found in Table 1, which
`
`shows a “logic high voltage” that is not higher than power supply voltage
`
`Vcc. PO Resp. 13 (citing Ex. 1001, Table 1).
`
`We disagree with Patent Owner’s contention that “logic high voltage”
`
`is limited by the nominal power supply voltage Vcc. Claims 1 and 4 recite
`
`voltages in relative terms to each other, using the terms “logic high voltage”
`
`and “logic low voltage” that do not appear in the written description of the
`
`’045 patent and only appear in the claims. See generally Ex. 1001.
`
`Although Table 1 of the ’045 patent contains references to Vcc, neither the
`
`claims nor the specification indicate that the written description limits logic
`
`high voltage to Vcc.2 Indeed, we do not find that the entries in Table 1 or
`
`any other portion of the ’045 patent written description show a clear
`
`intention to limit the scope of logic high voltage in claims 1 and 4 to Vcc.
`
`
`2 The Federal Circuit has stated that “while the specification [should be
`used] to interpret the meaning of a claim, courts must not import[]
`limitations from the specification into the claim.” In re Trans Texas
`Holdings Corp., 498 F.3d 1290, 1299 (Fed. Cir. 2007) (alterations in
`original) (citations omitted). The scope of a claim is restricted to a disclosed
`embodiment only when “the patentee has demonstrated a clear intention to
`limit the claim scope using words or expressions of manifest exclusion or
`restriction.” Liebel-Flarsheim Co. v. Medrad, Inc., 358 F.3d 898, 906
`(Fed. Cir. 2004).
`
` 8
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`IPR2014-00113
`Patent 6,058,045
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`Patent Owner’s proffered testimony that refers to the common understanding
`
`of Vcc as “the primary positive supply voltage to an IC” (Ex. 2001 ¶ 25)
`
`neither provides an explicit definition for the term “logic high voltage,” nor
`
`expressly limits the term “logic high voltage” to Vcc. Accordingly, we
`
`disagree with Patent Owner’s conclusion that the term “logic high voltage”
`
`is linked intrinsically to Vcc such that it should be capped by Vcc.
`
`See Tr. 30:24–25 (“the term logic high voltage is linked [ ] intrinsically to
`
`Vcc”), 35:13 (“intrinsically linked to Vcc”).
`
`We also agree with Petitioner (Reply 7–8) that Patent Owner’s claim
`
`construction arguments and testimony overlook the requisite standard of the
`
`broadest reasonable construction in light of the specification of the patent
`
`(see 37 C.F.R. § 42.100(b)), in an attempt to narrow the construction of
`
`“logic high voltage” to be nominally equal to or lower than Vcc (PO Resp.
`
`12; Ex. 2001 ¶ 32). The intrinsic evidence in the ’045 patent does not
`
`support limiting the “logic high voltage” to Vcc, as it expressly states that
`
`programming voltages may vary. Ex. 1001, 6:53–55 (describing voltage as
`
`“about Vcc”).
`
`Claim terms generally are given their ordinary and customary
`
`meaning, as would be understood by one of ordinary skill in the art in the
`
`context of the entire disclosure. See In re Translogic Tech., Inc., 504 F.3d at
`
`1257. We are unpersuaded, however, by Patent Owner’s arguments (PO
`
`Resp. 12; Tr. 34:6–19) that seek to limit “logic high voltage” to unclaimed
`
`power supplies and their supply voltages that are neither disclosed in the
`
`specification nor recited in the claims.
`
`We also are unpersuaded by Patent Owner’s arguments that a
`
`construction of “logic high voltage” that is not limited to Vcc lacks a
`
` 9
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`IPR2014-00113
`Patent 6,058,045
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`practical dividing line or reasonable boundaries. PO Resp. 13; see Ex. 2001
`
`¶¶ 31, 39; Ex. 2002 ¶¶ 27, 28. Patent Owner has provided insufficient
`
`argument and evidence that a person of ordinary skill in the art would
`
`understand the term “logic high voltage” to be limited by Vcc in the context
`
`of the ’045 patent. For example, Patent Owner points to no industry
`
`standard for flash memory devices and power supplies, other than
`
`unsupported testimony of a common understanding regarding Vcc and
`
`nominal power supplies. Ex. 2001 ¶¶ 31, 39; Ex. 2002 ¶¶ 27, 28.
`
`Patent Owner’s arguments that Petitioner’s expert lacks NAND flash
`
`memory experience and is not a person of ordinary skill in the art are also
`
`unavailing. PO Resp. 10. Patent Owner’s experts opined that a person of
`
`ordinary skill in the art would have at least 3 years of flash memory
`
`experience. Ex. 2001 ¶17; Ex. 2002 ¶ 19. We agree with Petitioner that its
`
`expert, Robert J. Murphy, has sufficient experience to meet the requirements
`
`of a person of ordinary skill in the art. Reply 4 (citing Deposition of Robert
`
`J. Murphy, Ex. 2003, 113:2–13, 114:11–117:6; 118:9–119:3). Indeed, we
`
`agree with Mr. Murphy’s declaration on the proposed construction of “logic
`
`high voltage” based on the specification of the ’045 patent. Ex. 1006 ¶ 17.
`
`Finally, we find that Petitioner’s proposed construction is consistent
`
`with the specification that states that voltage Vcc is applied to bit select
`
`control line (BSL), the unselected bit line, and the unselected word line
`
`during programming. See Ex. 1001, 6:37–45, 7:26–40; Ex. 1006 ¶ 17. We
`
`
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`10
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`IPR2014-00113
`Patent 6,058,045
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`determine that the broadest reasonable construction of “logic high voltage”
`
`is a positive voltage higher than the logic low voltage, such as Vcc.3
`
`2. Remaining Claim Terms
`
`Patent Owner does not contest the claim constructions for the terms
`
`“logic low voltage” (claims 1 and 4); “boosted positive voltage” (claims 1
`
`and 4); “selected bit line” and “unselected bit line” (claims 1 and 4); and
`
`“selected word line” and “unselected word line” (claims 1 and 4). In the
`
`Decision to Institute, we applied the broadest reasonable claim interpretation
`
`and interpreted the undisputed claim terms as follows (Dec. 7–9):
`
`Claim Term
`
`Construction
`
`“logic low voltage”
`
`“a low voltage, such as ground or Vss”
`
`“boosted positive voltage.”
`
`“a positive voltage higher than [the] logic
`high voltage”4
`
`
`3 Petitioner notes that the Board adopted Petitioner’s proposed construction
`for purposes of the Decision to Institute, but omitted the word “the” in the
`constructions for “logic high voltage” and “boosted positive voltage.”
`Reply 5; Dec. 7–9. As Patent Owner notes, the missing word (“the”) was
`not a “material change” to Petitioner’s proposed constructions. PO Resp. 7.
`In this Final Decision, our construction for “logic high voltage” inserts the
`word “the” into the construction, but does not alter our determination in our
`Decision to Institute or change our interpretation of the claim term.
`4 As Patent Owner notes, the missing word (“the”) was not a “material
`change” to Petitioner’s proposed constructions, which we adopted in our
`Decision to Institute. PO Resp. 7; see Dec. 7–8. Our use of the word “the”
`in the construction for “boosted positive voltage” in this Final Decision does
`not alter our determination in our Decision to Institute or change our
`interpretation of the claim term.
`
`
`
`11
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`IPR2014-00113
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`Claim Term
`
`“selected bit line”
`
`“unselected bit line”
`
`“selected word line”
`
`“unselected word line”
`
`
`
`Construction
`“the bit line connected to the column of
`memory cells containing the memory cell
`to be operated on”
`“the bit line connected to the column of
`memory cells containing the memory cell
`to be operated on”
`“the word line connected to the row of
`memory cells containing the memory cell
`to be operated on”
`“the word line connected to the row of
`memory cells containing the memory cell
`to be operated on”
`
`After considering all of the evidence now before us, we maintain these
`
`constructions for purposes of this Decision.
`
`B. Asserted Grounds of Unpatentability
`
`1. Anticipation by Nakai
`
`Petitioner contends that Nakai anticipates claims 1 and 4. Pet. 13–16.
`
`Petitioner relies on the Declaration of Robert J. Murphy (Ex. 1006)
`
`(“Murphy Declaration”) and provides detailed claim charts showing the
`
`claim limitations and the corresponding disclosure in Nakai (Pet. 17–29).
`
`For the reasons set forth below, Petitioner has shown by a preponderance of
`
`the evidence that Nakai discloses each limitation of claims 1 and 4.
`
`a. Nakai (Ex. 1005) Overview
`
`Nakai describes a semiconductor memory device that is a NAND type
`
`EEPROM arranged as an array. Ex. 1005, 1:20–26, Figs. 22(a), 25(a), 26.
`
`Nakai describes selecting a programmable memory cell within the array for
`
`read, write, and erase operations. Id. at 1:10–15, 1:46, 2:10. Figure 22(a),
`
`
`
`12
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`shown below, illustrates the structure of the array memory cells. Id. at 1:20–
`
`23, 6:65–66.
`
`
`
`“Fig[ure] 22(a) shows the structure of two NAND bundles each having eight
`
`memory cells MC of a floating gate structure and connected between a bit
`
`line and a source.” Id. at 1:2–23. Figure 22(a) shows select lines (SL), word
`
`lines (WL), bit lines (BL), and memory cells (MC). By setting select
`
`voltages to high or low levels at select lines and word lines, data in the
`
`selected memory cell can be read. Id. at 1:24–45.
`
`Similarly, Figures 23(a)–(c), shown below, depict a write operation
`
`for the memory cells of Figure 22(a). Id. at 1:46–47, 6:67–68.
`
`
`
`13
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`Figures 23(a)–(c) show a high voltage Vpp of about 20 V applied to a row to
`
`select a gate (Fig. 23(b) and (c) showing VPP) and intermediate voltage VPI
`
`of above 10 V applied to the remaining seven memory cells for unselected
`
`gates. Id. at 1:46–52. When the bit lines are set to specified voltages, write
`
`operations are performed at the selected write line (see Fig. 23(b) showing
`
`write cell at 0 V) and write operations are not performed at the non-write
`
`cells (see Fig. 23(c) showing non-write cell at VDP).
`
`Figure 25(a), reproduced below, shows the operation mode of a
`
`NAND structure semiconductor memory. Id. at 2:24–26.
`
`
`
`
`
`14
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`Figure 25(a) shows the semiconductor memory array laid out in bundles
`
`where “bit lines are laid out in the column direction, and 128 NAND bundles
`
`[equaling] 1024 word lines are laid out in the row direction.” Id. at 2:25–31.
`
`b. Anticipation of Claims 1 and 4
`
`We find that Nakai discloses the “flash memory” limitations of claims
`
`1 and 4 (Pet 17 (citing Ex. 1006 ¶ 22)) and that Figure 4 of the ’045 patent
`
`and Figure 22(a) of Nakai are the same, showing an array configuration of
`
`gates or cells with select, bit, and word lines (Pet. 14). We also agree with
`
`Petitioner that the programming voltages described in Figure 23(a) of Nakai
`
`are the same selected and unselected lines and voltages recited in the
`
`“programming” limitations of claims 1 and 4. Pet. 14–15. We also agree
`
`with Petitioner that one of ordinary skill in the art would understand Nakai
`
`to disclose applying a logic low voltage to a selected bit line as recited in
`
`claims 1 and 4 (“a logic low voltage is applied to a selected bit line while a
`
`logic high voltage is applied to unselected bit lines”). Pet. 15, 16, 21, 23.
`
`Similarly, we find that Nakai discloses that “a logic high voltage is applied
`
`to unselected word lines, while a boosted positive voltage is applied to a
`
`selected word line” in the write operation described and shown in Figure
`
`23(a). Pet. 27–28; Ex. 1005, 1:45–2:9.
`
`Patent Owner’s primary argument is that under a proper construction
`
`of “logic high voltage” that is bounded as higher than logic low voltage and
`
`less than or equal to the nominal value for Vcc, Nakai fails to anticipate
`
`because it applies a programming scheme that uses “boosted positive
`
`voltage” where claims 1 and 4 require “logic high voltage.” PO Resp. 12
`
`(providing proposed construction), 17 (applying construction to Nakai).
`
`Because we rejected Patent Owner’s limiting construction in Section II.A.1.,
`
`
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`15
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`we are not persuaded that Nakai fails to disclose a logic high voltage and a
`
`boosted positive voltage as recited in claims 1 and 4 and construed in
`
`Section II.A.1. Instead, under our construction for “logic high voltage,”
`
`which does not provide Vcc as an upper limit, we find that the programming
`
`voltages disclosed in Nakai (Ex. 1005 1:47–50, 1:53–57, 2:3, Fig. 23(a))
`
`provide relative voltages that correspond to the claimed logic high voltage,
`
`logic low voltage, and boosted positive voltage. See Pet. 16 (table
`
`summarizing Nakai programming voltages).
`
`We do not agree with Patent Owner’s arguments that the advantages
`
`of the ’045 patent’s programming scheme over the Nakai programming
`
`scheme is material to the application of “logic high voltage” as claimed to
`
`Nakai. PO Resp. 22. Patent Owner’s argument that ’045 patent
`
`programming scheme reduces the need for charge pumps or other the on-
`
`chip circuitry (PO Resp. 22–23) relies on features and functions that are
`
`beyond the scope of claims 1 and 4 and the written description that supports
`
`those claims. The ’045 patent claims do not recite, and the written
`
`description does not limit, the voltage sources used to provide the claimed
`
`voltages.
`
`Although Patent Owner states in a footnote that Nakai would not
`
`anticipate the limitations of claims 1 and 4 even if the Board does not adopt
`
`Patent Owner’s proposed construction for “logic high voltage,” Patent
`
`Owner’s argument incorrectly assumes that the Board’s construction limits
`
`logic high voltage to Vcc. PO Resp. 22 n.7. Under the Board’s
`
`construction, Vcc is provided as an exemplary voltage and does not limit the
`
`upper boundary under the broadest reasonable interpretation of “logic high
`
`voltage” to Vcc.
`
`
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`In sum, we have considered the evidence and argument presented by
`
`Petitioner and Patent Owner. We are persuaded that Petitioner’s evidence
`
`and argument show that Nakai anticipates the limitations of claims 1 and 4.
`
`Accordingly, we conclude that Petitioner has proven by a preponderance of
`
`the evidence that claims 1 and 4 are anticipated by Nakai.
`
`III. CONCLUSION
`
`Petitioner has demonstrated by a preponderance of the evidence that
`
`claims 1 and 4 of the ’045 patent are unpatentable based on 35 U.S.C.
`
`§ 102(b) as anticipated by Nakai.
`
`IV. ORDER
`
`For the reasons given, it is
`
`ORDERED that, based on a preponderance of the evidence, claims 1
`
`and 4 of U.S. Patent No. 6,058,045 are held unpatentable; and
`
`FURTHER ORDERED, because this is a final written decision, the
`
`parties to this proceeding seeking judicial review of our Decision must
`
`comply with the notice and service requirements of 37 C.F.R. § 90.2.
`
`
`
`
`
`
`
`
`
`
`
`17
`
`

`

`IPR2014-00113
`Patent 6,058,045
`
`
`PETITIONER:
`
`Alan A. Limbach
`Gerald T. Sekimura
`DLA PIPER LLP (US)
`alan.limbach@dlapiper.com
`gerald.sekimura@dlapiper.com
`
`PATENT OWNER:
`
`Robert Greene Sterne
`Jon E. Wright
`STERNE, KESSLER, GOLDSTEIN & FOX P.L.L.C.
`rsterne-PTAB@skgf.com
`jwright-PTAB@skgf.com
`
`
`
`18
`
`
`
`

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