(19) Japan Patent
`Office (JP)
`(51) Int.Cl.5
`H 01 J 61/90
`1/34
`
`Translation of JPH04-144053A
`
`(12) Japanese Patent
`Publication (A)
`
`Identification
`Number
` B
`
`
`(11) Japan Patent
`Publication Number
`JPH04-144053
`(43) Date of Publication
` May 18, 1992
`
`JPO Reference
`Number
`8019-5E
`9058-5E
`Request for Examination: Unrequested
`Number of claims: 5 (4 pages total)
`(54) Title of the Invention WHITE PULSED LIGHT GENERATING APPARATUS
`(21) JP Appl. No. H02-267882
`(22) Filing date: October 5, 1990
`c/o Hamamatsu Photonics K. K.
`1126-1, Ichino-cho, Hamamatsu City, Shizuoka
`(72) Inventor: HIRAMATSU Mitsuo, c/o Hamamatsu Photonics K. K.
`1126-1, Ichino-cho, Hamamatsu City, Shizuoka
`c/o Hamamatsu Photonics K. K.
`1126-1, Ichino-cho, Hamamatsu City, Shizuoka
`c/o Hamamatsu Photonics K. K.
`1126-1, Ichino-cho, Hamamatsu City, Shizuoka
`(71) Applicant: Hamamatsu Photonics K. K.
`1126-1, Ichino-cho, Hamamatsu City, Shizuoka
`(74) Agent: FURUSAWA Toshiaki, Patent attorney (and one other)
`
`(72) Inventor: ITO Toshiaki,
`
`(72) Inventor: MURAKI Koji,
`
`(72) Inventor: HIRANO Isuke
`
`SPECIFICATION
`1. Title of the Invention
`WHITE PULSED LIGHT GENERATING APPARATUS
`
`2. Claims
`(1) A white pulsed light generating apparatus in which a metal which readily
`emits electrons is provided in a transparent container, the container containing a
`gas therein and being irradiation target means, and the electron-emitting metal is
`irradiated with light having a high light intensity to cause predetermined white
`pulsed light to be generated from the electron-emitting metal, wherein separating
`means for separating the white pulsed light emitted from the electron-emitting
`metal is provided in substantially the same direction as an incident direction of
`the light having a high light intensity.
`(2) The white pulsed light generating apparatus according to claim (1), wherein
`the separating means is constituted by a beam sampler which reflects the light
`
`1
`
`ASML 1105
`
`

`
`Translation of JPH04-144053A
`
`having a high light intensity to irradiate the electron-emitting metal and transmits
`the white-pulsed light generated at the electron-emitting metal.
`(3) The white pulsed light generating apparatus according to claim (2), wherein
`the beam sampler is formed by vapor-depositing ZrO2, SiO2 onto a quartz
`substrate, the beam sampler reflecting approximately 100% of a laser of 1064
`nm, being the light having a high light intensity, and transmitting approximately
`100% of the generated white pulsed light.
`(4) The white pulsed light generating apparatus according to claim (1), (2) or
`(3), wherein a lens having a short focal length for focusing the light having a high
`light intensity onto the electron-emitting metal is inserted between the separating
`means and the irradiation target means,
`(5) The white pulsed light generating apparatus according to claim (1), wherein
`the separating means has a passage hole for allowing the light having a high
`light intensity for irradiating the electron-emitting metal to pass therethrough, the
`separating means being constituted by a reflecting mirror which reflects the
`generated white pulsed light.
`
`3. Detailed Description of the Invention
`[Technical Field of the Invention]
`The present invention relates to a white pulsed light generating apparatus for
`obtaining white pulsed light with a high luminance.
`[Prior Art]
`It is known that irradiation of an electrode (cathode) in a xenon lamp to which
`no voltage is applied with, for example, a YAG laser of a fundamental
`wavelength (1064 nm) causes white pulsed light with a high luminance to be
`generated. This white pulsed light is used, for example, as probe light in a
`time-resolved absorption measuring apparatus which uses a streak camera as a
`detector.
`In the time-resolved absorption apparatuses of this type, as shown in Fig. 5, a
`sample (10) is irradiated with excitation light (9) of a laser pulse, and the spectra
`and changes in the strength of excited species and reaction intermediates
`generated in the sample (10) are tracked using white probe light (11) which is
`white light having a continuous spectrum, where the changes in the strength of
`the probe light (11) are detected by a streak camera (12) to observe the transient
`absorption spectrum and changes in its strength.
`As shown in Fig. 5, a generating apparatus for the white probe light (11): uses
`
`2
`
`

`
`Translation of JPH04-144053A
`
`a lens (1) to focus light having a high light intensity, e.g., a YAG laser of a
`fundamental wavelength (1064 nm), onto a front side of a cathode (4) in a xenon
`lamp (3), being irradiation target means, to generate white light (5); extracts the
`generated white light (5); collects the light using a lens (6); and sends the light
`via an optical fiber (7) to the sample (10).
`[Problem to be Solved by the Invention]
`When the incident laser (2) is focused onto the cathode (4) in the xenon lamp
`(3) as described above, the white pulsed light is generated from the cathode (4).
`The white pulsed light is emitted with a high intensity particularly in a plane (13)
`(the hatched portion in Fig. 5) in substantially the same path as the incident path
`of the laser (2). However, since it has been structurally impossible to extract
`the white pulsed light from the same path as the incident path of the laser (2) in
`the related art, there has been no other way but to extract the white pulsed light
`from a lateral side thereof, as shown in Fig. 5.
`It is an object of the present invention to provide an apparatus capable of
`extracting highly-efficient white pulsed light from a portion where it is emitted
`with a high intensity in substantially the same path as the incident path of the
`light having a high light intensity and further capable of preventing damage from
`the incident light as a result of the above configuration.
`[Means for Solving the Problem]
`The present invention provides an apparatus in which a metal which readily
`emits electrons is provided in a transparent container, the container containing a
`gas therein and being irradiation target means, and the electron-emitting metal is
`irradiated with light having a high light intensity to cause predetermined white
`pulsed light to be generated from the electron-emitting metal, wherein separating
`means for separating the white pulsed light emitted from the electron-emitting
`metal is provided in substantially the same direction as an incident direction of
`the light having a high light intensity.
`[Effect]
`If a laser is used as the light having a high light intensity, the beam diameter of
`the incident laser should first be expanded to a maximum extent. By providing
`a lens having a short focal length, the laser with such large beam diameter is
`transmitted through a portion in the glass surface in the xenon lamp in such a
`state that the beam diameter is expanded to a maximum extent to thereby
`minimize damage to the glass surface portion. The transmitted laser is focused
`onto the cathode in the xenon lamp and white light is generated at the cathode.
`
`3
`
`

`
`Translation of JPH04-144053A
`
`Only white pulsed light emitted in substantially the same path as the incident
`path of the laser, from among the generated white pulsed light, is separated by
`the separating means and sent to the next stage via an optical fiber.
`[Embodiments of the Invention]
`An embodiment of the present invention will be described below with reference
`to the attached drawings.
`In Fig. 1, reference numeral (2) denotes light having a high light intensity, e.g.,
`a laser pulse having a fundamental wavelength of 1064 nm, 30 ps and 30 mJ
`generated by an Nd:YAG laser apparatus. This laser (2) is allowed to be
`incident on a cathode (4), being an electron-emitting metal, and light emitted by
`the cathode (4) is sent to separating means for separating it from the laser (2),
`i.e., a beam sampler (8) such as a dichroic mirror. This beam sampler (8) is
`formed by vapor depositing approximately 16 layers of ZrO2, SiO2 onto a quartz
`substrate. Such beam sampler (8) is formed so as to have the property of
`reflecting approximately 100% of light of around 1064 nm and transmitting
`approximately 100% of the visible light range as shown in Fig. 2 and so as to
`further have a high optical damage threshold. The laser (2) reflected by the
`beam sampler (8) irradiates, through a lens (1), the electrode (cathode) (4) in the
`xenon lamp (3), being irradiation target means. At this time, if a glass surface
`(14) of the xenon lamp (3) has a large radius, the glass surface (14) will not
`suffer from damage. However, if the glass surface (14) has a small radius, the
`lens (1) is configured to be aspheric so as to have a short focal length and is
`placed as close as possible to the xenon lamp (3), so that the laser (2) can be
`transmitted through the glass surface (14) of the xenon lamp (3) in such a state
`that its beam diameter has first be expanded, to thereby minimize damage to the
`glass surface (14). When the laser (2) is focused onto the cathode (4) in the
`xenon lamp (3), white pulsed light (5) is generated at substantially the whole
`circumference of the cathode (4). Since the white pulsed light (5) in a plane
`which is the same as the plane of incidence of the laser (2), from among the
`generated white pulsed light (5), is emitted with the highest intensity, the white
`pulsed light (5) in the same path as the incident path is collected. The collected
`light is allowed to pass through the lens (1) again and turned into parallel light
`beams. The beam sampler (8) transmits approximately 100% of the visible
`light range of the white pulsed light (5) and the transmitted white pulsed light (5)
`is further focused by the lens (6) into an optical fiber (7) and sent to the next
`stage by the optical fiber (7).
`
`4
`
`

`
`Translation of JPH04-144053A
`
`Although the above embodiment has described an example in which the
`cathode (4) in the xenon lamp (3) is irradiated with the laser (2) to obtain the
`white pulsed light (5), the present invention is not limited thereto. Specifically, a
`sealed transparent container may be used as the glass tube, the transparent
`container being filled with an inert gas such as xenon, and as a metal which
`readily emits electrons in the container, tungsten containing alkali metals or alkali
`earth metals such as, for example, barium or thorium may be used. In addition,
`the irradiation light source may not necessarily be a laser and may employ any
`light having a high light intensity. The gas filling the tube may also be krypton
`other than the xenon. However, the use of krypton would produce a slightly
`reddish pulsed light.
`Although the above embodiment employs the beam sampler (8) as separating
`means for refracting the light having a high light intensity so as to be incident on
`the electron-emitting metal (4) and for transmitting the white pulsed light (5),
`other examples will be described with reference to Figs. 3 and 4.
`In Fig. 3, the separating means is constituted by a planar reflecting mirror (8)
`and a lens (6), where the light having a high light intensity is allowed to pass
`through a passage hole (15) at the center of the planar reflecting mirror (8) to
`irradiate the electron-emitting metal (4) in the transparent container (14). Since
`the beam diameter at this point in time is small, this configuration should be
`employed only when the light does not cause damage to the glass surface (14)
`when passing through the transparent container (14). The generated white
`pulsed light (5) is reflected by the planar reflecting mirror (8) and focused by the
`lens (6) into the optical fiber (7).
`Note that the separating means constituted by the planar reflecting mirror (8)
`and the lens (6) may be replaced with that employing a concave mirror (8), as
`shown in Fig. 4.
`[Effect of the Invention]
`Since the present invention has the configurations as described above, the
`white pulsed light can be efficiently collected at the portion where it is emitted
`with the highest intensity. In addition, the provision of a lens with a short focal
`length can allow the beam having a large diameter to be transmitted through the
`glass surface and can thus prevent damage to the glass surface.
`
`4. Brief Descriptions of the Drawings
`Fig. 1 is a diagram for illustrating a first embodiment of a white pulsed light
`
`5
`
`

`
`Translation of JPH04-144053A
`
`generating apparatus according to the present invention.
`Fig. 2 is a diagram showing wavelength characteristics of a beam sampler.
`Fig. 3 is a diagram for illustrating a second embodiment of a white pulsed light
`generating apparatus according to the present invention.
`Fig. 4 is a diagram for illustrating a third embodiment of a white pulsed light
`generating apparatus according to the present invention.
`Fig. 5 is a diagram for illustrating a related-art apparatus.
`(1)
`Lens
`(2)
`Light having a high light intensity
`(3)
`Irradiation target means
`(4)
`Electron-emitting metal
`(5) White pulsed light
`(6)
`Lens
`(7) Optical fiber
`(8)
`Separating means for separating incident light and outgoing light
`(9)
`Excitation light
`(10) Sample
`(11) White probe light
`(12) Streak camera
`(14) Transparent container (glass surface)
`(15) Passage hole
`
`6
`
`

`
`Translation of JPH04-144053A
`
`Fig. 1
`1
`2
`3
`4
`5
`6
`7
`8
`14
`
`Lens
`Light having a high light intensity
`Irradiation target means
`Electron-emitting metal
`White pulsed light
`Lens
`Optical fiber
`Separating means of white pulsed light
`Transparent container
`
`Fig. 2
`Y-axis: Transmissivity
`X-axis: Visible range, Wavelength(nm)
`
`Fig. 3
`2
`4
`6
`7
`8
`14
`15
`
`Fig. 4
`4
`
`Light having a high light intensity
`Electron-emitting metal
`Lens
`Optical fiber
`Separating means of white pulsed light
`Transparent container
`Passage hole
`
`Electron-emitting metal
`
`Fig. 5
`Irradiation target means
`3
`Streak camera
`12
`14 Glass surface
`
`7
`
`

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`
`STATEMENT OF ACCURACY
`
`I, Hiroki Sato, c/o TMI ASSOCIATES of 23rd Floor, Roppongi Hills Mori Tower, 6-
`
`10-1, Roppongi, Minato—ku, Tokyo 106-6123, Japan, do solemnly and sincerely declare that I
`
`well understand the Japanese and English languages and that the attached English Version is
`
`full, true and faithful translation made by me this 30”‘ day of September 2013 of Japanese
`
`Patent Publication No. JPH04-144OS3A.
`
`In testimony whereof, I have hereunto set my name and seal this 10”‘ day of December
`
`2015‘
`
`December 10, 2015
`
`Hiroki Sato
`
`
`
`12
`
`12