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`CURRICULUM VITÆ
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`Jonathan D. Ellis, PhD
`Associate Professor of Mechanical Engineering
`University of Rochester
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`ACADEMIC VISION
`Precision technology permeates daily life in the form of smartphones,
`automobiles, consumer electronics, computing technology, healthcare systems,
`and airplanes, to name a few. These products incorporate many precision
`engineering concepts in the design, manufacture, assembly, and quality control
`steps to bring them to fruition. These precision engineering concepts are: 1)
`design for function and performance; 2) understand multi-disciplinary systems,
`methodologies, and metrology; and 3) qualify error budgets and uncertainty
`estimates to ensure specifications are met.
`The goal of the PRECISION I NSTRUMENTATION GROUP is to design, create, and
`demonstrate novel precision systems to usher in the next generation of
`technology. Research in the Precision Instrumentation Group focuses on real-
`world challenges where novel solutions can be offered, particularly in areas like
`standards-level metrology, high precision positioning systems, biological
`scanners, optical metrology, and advanced manufacturing. These research
`endeavors should result in technology pioneered within the group to permeate
`precision systems in commercial industries. The Precision Instrumentation
`Group focuses on performing the multidisciplinary system design, building
`prototype systems, qualifying technology, and, finally, spinning off technology
`so that it can be commercialized and launched into industry.
`Student mentorship is the fundamental backbone of academia, both by nurturing
`the student's curiosity and by shaping the student's future career. Research in an
`exciting, stimulating, and challenging environment can provide opportunities
`for students to learn from a multitude of sources, including their fellow peers,
`senior students, their faculty advisor, and the community at large. The Precision
`Instrumentation Group
`is a multi-disciplinary community with ties to
`mechanical, optical, and electrical engineering. Students in the group research
`high-impact fields, create novel solutions to today's multidisciplinary challenges,
`produce professional, technologically relevant results, and communicate
`effectively when disseminating their work.
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`Curriculum Vitæ
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`EMPLOYMENT
`ASSOCIATE PROFESSOR with tenure
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`JAMES P. WILMOT ASSISTANT PROFESSOR
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`ASSISTANT PROFESSOR OF MECHANICAL ENGINEERING AND OF OPTICS
`University of Rochester; Rochester, NY USA
`Hajim School of Engineering & Applied Sciences
`Department of Mechanical Engineering
`Affiliations: Center for Freeform Optics, R.E. Hopkins Center for Optical Design & Engineering
`CO-FOUNDER & DIRECTOR OF RESEARCH
`Clerio Vision, Inc.; Rochester, NY USA
`PHD RESEARCHER
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`Delft University of Technology; Delft, The Netherlands
`Precision & Microsystems Engineering: Mechatronic System Design
`RESEARCH ASSISTANT
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`University of North Carolina at Charlotte; Charlotte, NC USA
`Center for Precision Metrology
`I NSTRUMENTATION ENGINEER
`UNDERGRADUATE RESEARCH ASSISTANT
`InSituTec Incorporated; Concord, NC USA
`Supervised by: Dr. Shane C. Woody (InSituTec) & Prof. Stuart T. Smith (UNC Charlotte)
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`Jonathan D. Ellis
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`7/2017-
`7/2015-6/2017
`7/2011-6/2017
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`2014-
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`2/2007-12/2010
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`8/2005-2/2007
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`5/2005-8/2005
`8/2004-5/2005
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`12/2010
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`5/2007
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`5/2005
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`EDUCATION
`DOCTORATE OF PHILOSOPHY , MECHANICAL ENGINEERING
`Delft University of Technology; Delft, The Netherlands
`Dissertation: Optical Metrology Techniques for Dimensional Stability Measurements
`Advisors: Prof. ir. Robert H. Munnig Schmidt & ir. Jo W. Spronck
`MASTER OF SCIENCE, MECHANICAL ENGINEERING
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`University of North Carolina at Charlotte; Charlotte, NC USA
`Thesis: Reducing Frame Stiffness Dependency in Nanoindentation
`Advisors: Prof. Stuart T. Smith & Prof Robert J. Hocken
`BACHELOR OF SCIENCE, MECHANICAL ENGINEERING
`University of North Carolina at Charlotte; Charlotte, NC USA
`GPA: 3.6/4.0; Cum Laude
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`PUBLICATIONS
`BOOKS
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`Butler SC, Ricci MA, Ellis JD. SPIE Spotlight: Optical Methods for Point-to-Point Metrology, SPIE Press
`(currently contracted)
`Ellis JD, Smith ST, Badami VG. ASPE Handbook: Flexures, ASPE Press (currently contracted)
`Ellis JD. Field Guide to Displacement Interferometry, SPIE Press 2014 (print ISBN: 978-0-8194-9799-4,
`ebook: 978-0-8194-9800-7)
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`Ellis JD. Optical Metrology Techniques for Dimensional Stability Measurements, PhD Thesis, Delft University
`of Technology (print ISBN: 978-94-91104-06-0)
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`JOURNAL PUBLICATIONS
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`Lu C, Burnham-Fay ED, Ellis JD, Schmitz TL, Tarbutton JA. Periodic Error Compensation in Fiber-
`coupled Heterodyne Interferometry. Procedia Manufacturing 2017; 10: 674-682 [www]
`29 Wozniak KT, Gearhart SM, Savage DE, DeMagistris M, Ellis JD, Knox WH, Huxlin KR. Comparison of
`Refractive Index Change via Non-Invasive Femtosecond Laser Processing in Human and Cat Corneas.
`Journal of Biomedical Optics 2016; (accepted – in press)
`Gillmer SR, Abdolrahim N, Wayson SE, Winans JD, Fang DZ, DesOrmeaux JPS, Getpreecharsawas J,
`Ellis JD, Fauchet PM, McGrath JL. Predicting the failure of ultrathin porous membranes via bulge test.
`Thin Solid Films 2016; 631:152-160 [www]
`Corsetti JA, Green WE, Ellis JD, Schmidt GR, Moore DT. Simultaneous interferometric measurement
`of CTE and dn/dT of optical materials. Optical Engineering 2016; 55(29):8145-8152 [www]
`26 Wang C, Burnham-Fay ED, Ellis JD. Real-time FPGA-based Kalman filter for constant and non-
`constant velocity periodic error correction. Precision Engineering 2016; (accepted-in press) [www]
`25 Wang C, Ellis JD. Data age error compensation for non-constant velocity metrology. IEEE Transactions
`on Instrumentation and Measurement 2016; 65(11):2601-2611 [www]
`Yu X, Zhang T, Ellis JD. Absolute air refractive index measurement and tracking based on variable
`length vacuum cell. Optical Engineering 2016; 55(6):0641112 [www]
`Yu X, Gillmer SR, Woody SC, Ellis JD. Development of a compact, fiber-coupled, six degree-of-
`freedom measurement system for precision linear stage metrology. Review of Scientific Instruments
`2016; 87(6):065109 [www]
`Lu C, Troutman JR, Schmitz TL, Ellis JD, Tarbutton JA. Application of the continuous wavelet
`transform in periodic error compensation. Precision Engineering 2016; 44:245–251 [www]
`Yu X, Gillmer SR, Ellis JD. Beam geometry, alignment, and wavefront aberration effects on
`interferometric differential wavefront sensing. Measurement Science & Technology 2015; 26(12): 125203
`[www]
`Gandara-Montano GA, Ivansky A, Savage DE, Ellis JD, Knox WH. Femtosecond laser micromachining
`of freeform gradient index microlenses in hydrogel-based contact lenses. Optical Materials Express
`2015; 5(10):242830 [www]
`Zhao Y, Schmidt G, Moore DT, Ellis JD. Absolute thickness metrology with sub-micrometer accuracy
`using a low coherence distance measuring interferometer. Applied Optics 2015; 54(25):7693–7700
`[www]
`Gillmer SR, Yu X,Wang C, Ellis JD. Robust high dynamic range optical roll sensing. Optics Letters 2015;
`40(11):2497–2500 [www]
`17 Wang C, Ellis JD. Dynamic Doppler frequency shift errors: measurement, characterization, and
`compensation. IEEE Transactions on Instrumentation and Measurement 2015; 64(7):1994–2004 [www]
`Savage DE, Brooks DR, DeMagistris M, Xu L, MacRae S, Ellis JD, Knox WH, Huxlin KR. First
`Demonstration of Ocular Refractive Change using Blue-IRIS in Live Cats. Investigative Ophthalmology &
`Visual Science 2014; 55(7):4603–4612 [www]
`Echter MA, Roll CD, Keene AD, Ellis JD. Carrier fringe analysis algorithms for three degree of freedom
`optical probing, Precision Engineering 2014; 34(4):893–902 [www]
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`Brooks DR, Brown NS, Savage DE, Wang C, Knox WH, Ellis JD. Precision large € field scanning system
`for high numerical aperture lenses and application to femtosecond micromachining of ophthalmic
`materials. Review of Scientific Instruments 2014; 85(6): 065107 [www]
`Gillmer SR, Smith RCG, Woody SC, Ellis JD. Compact € fiber-coupled three degree-of-freedom
`displacement interferometry for nanopositioning stage calibration. Measurement Science & Technology
`2014; 25(7): 075205 [www]
`Zhu M, Li Y, Ellis JD. Polarization model for total internal reflection-based retroreflectors. Optical
`Engineering 2014; 53(6): 064101 [www]
`Ellis JD, Baas M, Joo K, Spronck JW. Errors in correction algorithms for periodic nonlinearity in
`displacement measuring interferometers. Precision Engineering 2012; 36(2):261–269 [www]
`Ellis JD, Voigt D, Spronck JW, Verlaan AL, Munnig Schmidt RH. Frequency Stabilized HeNe Gas Laser
`with 3.5 mW from a single mode. Precision Engineering 2012; 36(2):203–209 [www]
`Ellis JD, Meskers AJH, Spronck JW, Munnig Schmidt RH. Fiber coupled displacement interferometry
`without periodic nonlinearity. Optics Letters 2011; 36(18):3584–3586 [www]
`8 Voigt D, Ellis JD, Verlaan AL, Bergmans RH, Spronck JW, Munnig Schmidt RH. Towards
`interferometry for dimensional drift measurements with nanometer uncertainty. Measurement
`Science & Technology 2011; 22:094029 (5pp) [www]
`Joo K, Ellis JD, Spronck JW, Munnig Schmidt RH. Real-time wavelength corrected heterodyne laser
`interferometry. Precision Engineering 2010; 35(1):38–43 [www]
`Ellis JD, Joo K, Buice ES, Spronck JW. Frequency stabilized three mode HeNe laser using nonlinear
`optical phenomena. Optics Express 2010; 18(2):1373–1379 [www]
`Joo K, Ellis JD, Buice ES, Spronck JW, Munnig Schmidt RH. High resolution heterodyne interferometer
`without detectable periodic nonlinearity. Optics Express 2010; 18(2):1159–1165 [www]
`Joo K, Ellis JD, Spronck JW, Munnig Schmidt RH. Design of a folded, multi-pass Fabry-Perot
`interferometer using a He-Ne laser for displacement metrology (Technical Design Note). Measurement
`Science & Technology 2009; 20(10):107001 (5pp) [www]
`Ellis JD, Joo K, Spronck JW, Munnig Schmidt RH. Balanced interferometric system for stability
`measurements. Applied Optics 2009; 48(9):1733–1740 [www]
`Joo K, Ellis JD, Spronck JW, van Kan PJM, Munnig Schmidt RH. A simple heterodyne laser
`interferometer with sub-nm periodic errors. Optics Letters 2009; 34(3):386–388 [www]
`Ellis JD, Smith ST, Hocken RJ. Alignment uncertainties in ideal indentation styli, Precision Engineering
`2008; 32:207–214 [www]
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`I N REVIEW & REVISION
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`3 Wang C, Zhong F, Ellis JD. Two-dimensional straightness measurement based on optical knife-edge
`sensing. Review of Scientific Instruments 207 (under review)
`2 Wozniak KT, Elkins N, Brooks DR, Savage DE, DeMagistris M, MacRae S, Ellis JD, Knox WH, Huxlin KR.
`Contrasting the Impact of LIRIC and LASIK on Keratocyte Viability in Cat Cornea. Experimental Eye
`Research 2017; (under review)
`Ricci MA, Butler SC, Ellis JD. Design of a compact homodyne displacement measuring interferometer
`with tip and tilt sensitivity. Precision Engineering 2016; (in revision)
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`CONFERENCE PROCEEDINGS
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`Zhao Y*, Schmidt GR, Ellis JD, Moore DT. Low-coherence interferometer measuring absolute
`thickness and topography with high accuracy. OF&T-Optical Fabrication & Testing, 09-13 July 2017,
`Denver, CO USA (accepted)
`Corsetti JA*, Green WE, Ellis JD, Schmidt GR, Moore DT. Measurement of linear coefficient of thermal
`expansion and temperature-dependent refractive index using interferometric system. OF&T-Optical
`Fabrication & Testing, 09-13 July 2017, Denver, CO USA (accepted)
`Ellis JD*, Brooks DR, Wozniak KT, Gandara-Montano GA, Fox EG, Tinkham KJ, Butler SC, Zheleznyak
`LA, Buckley MR, Funkenbusch PD, Knox WH. Manufacturing of gradient index lenses for ophthalmic
`applications. OF&T-Optical Fabrication & Testing, 09-13 July 2017, Denver, CO USA (accepted)
`Brooks DR*, Ellis JD. Curved image plane objective for femtosecond micro-modification of contact
`lenses. IODC-International Optical Design Conference, 09-13 July 2017, Denver, CO USA (accepted)
`Ellis JD*, Brook DR, Butler SC, Zheleznyak LA, Gandara-Montano GA, Wozniak KT, Knox WH.
`Scalability in contact lens manufacturing to improve the refractive performance and user comfort.
`ASPE Spring Topical Meeting: Precision Engineering & Optics, 24-25 April 2017, Tucson, AZ USA
`Zheleznyak LA, Gandara-Montano GA, Huxlin KR, Ellis JD, Yoon G, Knox WH. First demonstration of
`human visual performance through refractive-index-modified ophthalmic devices written in
`hydrogels. ARVO, 7-11 May 2017, Baltimore, MD USA
`Browar AEM, Shusteff M, Panas RM, Ellis JD, Spadaccini CM. Overview and comparison of spatial light
`modulator calibration methods. 31st ASPE Annual Meeting, 23-28 Oct 2016, Portland, OR USA
`62 Wang C*, Yu X, Gillmer SR, Ellis JD. Straightness measurement based on knife-edge sensing. 31st ASPE
`Annual Meeting, 23-28 Oct 2016, Portland, OR USA
`Green WE, Corsetti JA, Schmidt GR, Moore DT, Ellis JD. Development of a Michelson interferometer
`capable of measuring the thermal properties of optical materials. 31st ASPE Annual Meeting, 23-28 Oct
`2016, Portland, OR USA
`Ellis JD*, Gandara-Montano GA, Brooks DR, Wozniak KT, Gearhart SM, Zheleznyak LA, Funkenbusch
`PD, Knox WH, Huxlin KR, IRIS- a new paradigm in laser refractive correction, Frontiers in Optics, 17-21
`Sept 2016, Rochester, NY USA (invited presentation)
`59 Wozniak KT, Elkins N, Brooks D, Savage D, DeMagistris M, MacRae S, Hindman HB, Ellis JD, Knox WH,
`Huxlin KR. Differential impact of LIRIC and femto-LASIK on keratocyte viability in cat cornea, ARVO
`2016, 1-5 May 2016, Seattle, WA USA
`Ricci MA, Butler SC, Wang C, Ellis JD. 3 axis homodyne displacement measuring interferometer probe
`for freeform optics. 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA
`57 Wang C, Ellis JD. Real-time periodic error correction for heterodyne interferometers using Kalman
`Filters. 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA
`Yu X, Gillmer SR, Howard SC, Woody SC, Ellis JD. Compact six degree-of-freedom interferometer for
`precision linear stage metrology. 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA
`Lu C, Ellis JD, Schmitz TL, Tarbutton JA. Improvement of a periodic error compensation algorithm
`based on the continuous wavelet transform. 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA
`Gillmer SR, Head ST, Theisen MJ, Brown TG, Ellis JD. Systems-level integration for focused beam
`scatterometry, 30th ASPE Annual Meeting, 1-6 Nov 2015, Austin, TX USA
`Butler SC, Ricci MA, Wang C, Wei Q, Ellis JD. Homodyne displacement measuring interferometer
`probe for optical coordinate measuring machine with tip and tilt sensitivity. Proc. SPIE 9633:96332E
`(2015)
`Burnham-Fay ED*, Jacobs-Perkins D, Ellis JD. Interferometric strain measurements with a fiber optic
`probe. Proc. SPIE 9576: 95760F (2015)
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`Yu X*, Ellis JD. Experimentally investigate the alignment and beam aberration effects on
`interferometric differential wavefront sensing. ASPE Summer Topical Meeting: Precision Interferometric
`Metrology, 8 - 10 July 2015, Golden, CO USA
`Yu X*, Zhang T, Ellis JD. Absolute refractive index sensing and tracking based on a variable length
`vacuum cell. ASPE Summer Topical Meeting: Precision Interferometric Metrology, 8 - 10 July 2015, Golden,
`CO USA
`Butler SC, Ricci MA, Yu X, Ellis JD. OCMM Displacement Measuring Interferometer Probe with 3-DoF
`Measurement. OSA Imaging and Applied Optics Congress: Freeform Optics, 7-11 June 2015, Arlington, VA
`USA
`Browar AEM*, Green WE, Burns SJ, Ellis JD. Characterization of the optical properties of printoptical
`lenses. ASPE Summer Topical Meeting: Achieving Precision Tolerances in Additive Manufacturing, 26-29 April
`2015, Raleigh, NC USA
`Brooks DR, Brown NS, Savage DE, Knox WH, Ellis JD. Large stroke scanning system for femtosecond
`micromachining of custom optical structures in ophthalmic materials. 29th ASPE Annual Meeting, 9-14
`Nov 2014, Boston, MA USA
`Yu X, Gillmer SR, Wang C, Ellis JD. Beam aberration analysis of differential wavefront interferometry.
`29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA
`Zhao Y, Schmidt G, Moore DT, Ellis JD. Absolute thickness metrology with high precision using low
`coherence interferometry. 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston, MA USA
`44 Wang C*, Ellis JD. Phase compensation for dynamic Doppler frequency shifts. 29th ASPE Annual
`Meeting, 9-14 Nov 2014, Boston, MA USA
`Keene AD, Pullan EE, Ricci MA, Lanphear J, Echter MA, Ellis JD. Fiber launching device with
`polarization control and alignment-preserving reconnection. 29th ASPE Annual Meeting, 9-14 Nov 2014,
`Boston, MA USA
`Lu C, Troutman JR, Ellis JD, Schmitz TL, Tarbutton JA. Periodic error compensation using frequency
`measurement with continuous wavelet transform. 29th ASPE Annual Meeting, 9-14 Nov 2014, Boston,
`MA USA
`Ellis JD*, Echter MA. Non-contact, point-to-point methods for measuring freeform optics. Optical
`Fabrication & Testing, 22–26 Jun 2014, Kohala Coast, HI USA [Invited]
`Theisen MJ, Head ST, Brown TG, Gillmer SR, Ellis JD. Amplitude, phase, and polarization control with
`a single spatial light modulator. Proc. SPIE 8949:89491X (2014)
`Brown TG, Alonso MA, Vella A, Theisen MJ, Head ST, Gillmer SR, Ellis JD Focused beam scatterometry
`for deep subwavelength metrology. Proc. SPIE 8949:89490Y (2014)
`Lu C, Gillmer SR, Ellis JD, Schmitz TL, Troutman J, Tarbutton JA. Application of wavelet analysis in
`heterodyne interferometry. 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN USA
`Fesperman R, Brown N, Elliot K, Ellis JD, Grabowski A, Ludwick S, Maneuf S, O’Conner B, Woody S.
`Methods for performance evaluation of single axis positioning systems: a new standard. 28th ASPE
`Annual Meeting, 20-25 Oct 2013, St. Paul, MN USA
`Fesperman R, O’Conner B, Ellis JD. Methods for performance evaluation of single axis positioning
`systems: dynamic straightness. 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN USA
`Ellis JD, Gillmer SR, O’Connor B. Methods for performance evaluation of single axis positioning
`systems: dynamic angular performance. 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN US
`Ellis JD, Ludwick S. Methods for performance evaluation of single axis positioning systems: move
`and settle performance. 28th ASPE Annual Meeting, 20-25 Oct 2013, St. Paul, MN USA
`Zhu M, Li Y, Ellis JD. Retroreflector Polarization Model. 28th ASPE Annual Meeting, 20-25 Oct 2013, St.
`Paul, MN USA
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`Brooks DR*, Brown NS, Xu L, Savage DE, Knox WH, Ellis JD. Precision high numerical aperture
`scanning system for femtosecond micromachining of ophthalmic materials over large field. 28th ASPE
`Annual Meeting, 20-25 Oct 2013, St. Paul, MN USA
`Echter MA, Roll CD, Keene AD, Ellis JD. Three degree-of-freedom optical probe with fiber detection
`using carrier fringe methods. 28th ASPE Annual Meeting, 20–25 Oct 2013, St. Paul , MN, USA
`Echter MA, Roll CD, Keene AD, Ellis JD. Slope-sensitive optical probe for freeform optics metrology.
`Proc. SPIE 8884:88842C (2013) [APOMA Best Poster Award]
`Briggs D*, Echaves S, Pidgeon B, Travis N, Ellis JD. Stiffness and Contact Area Testing in UltraForm
`Finishing. Proc. SPIE 8884:888405 (2013)
`Gillmer SR*, Ellis JD. Design Considerations in a Novel Fiber-Coupled Three Degree-of-Freedom
`Displacement Interferometer. Proc. SPIE 8836:883604 (2013)
`Briggs D*, Echaves S, Pidgeon B, Travis N, Ellis JD. Accurately measuring dynamic coefficient of
`friction in UltraForm Finishing. Proc. SPIE 8838:88380U (2013)
`Gillmer SR*, Smith RGC, Woody SC, Tarbutton J, Ellis JD. Miniature, fiber-coupled 3-DOF
`interferometer for precision micro-motion stage metrology. 27th ASPE Annual Meeting, 21–26 Oct 2012,
`San Diego, CA, USA
`Smith RGC, Wang C, Ellis JD. Sensitivity of optical fibers to mechanical and thermal perturbations
`for interferometric applications. 27th ASPE Annual Meeting, 21–26 Oct 2012, San Diego, CA, USA
`Burnham-Fay ED, Ellis JD. Precision flexure stage utilizing parasitic motion. 27th ASPE Annual Meeting,
`21–26 Oct 2012, San Diego, CA, USA
`Katz P, Lynch T, Magill A, Maag-Tanchack J, Ellis JD. UFF Belt Characterization. Optical Fabrication &
`Testing, 24–28 Jun 2012, Monterey, CA, USA
`Ellis JD*, Gillmer SR, Wang C, Smith RGC, Woody SC, Tarbutton J. Fiber-coupled 3-DOF interferometer
`for EUV lithography stage metrology. ASPE Summer Topical Meeting: Precision Engineering and
`Mechatronics Supporting the Semiconductor Industry, 24–26 Jun 2012, Berkeley, CA, USA
`Ellis JD, Voigt D, Spronck JW, Verlaan AL, Munnig Schmidt RH. Stabilized HeNe gas laser with greater
`than 3.5 mW of optical power. 26th ASPE Annual Meeting, 13–18 Nov 2011, Denver, CO, USA
`Ellis JD*, Meskers AJH, Spronck JW, Munnig Schmidt RH. Towards fiber-coupled displacement
`measuring interferometers. 26th ASPE Annual Meeting, 13–18 Nov 2011, Denver, CO, USA
`19 Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Displacement
`interferometry for dimensional stability measurements. International Congress of Metrology, 3–6
`October 2011, Paris, France
`Genberg V*, Ellis JD. Training of optomechanical engineers at the University of Rochester. Proc. SPIE
`8125: 812506 (2011)
`17 Meskers AJH, Ellis JD, Spronck JW, Munnig Schmidt RH. Displacement interferometry with fiber
`coupled delivery. 10th IMEKO Symposium, 12–14 Sept 2011, Braunschweig, Germany
`16 Meskers AJH, Ellis JD, Spronck JW, Munnig Schmidt RH. Fiber coupled sub nanometer displacement
`interferometry without periodic nonlinearity. 10th International Symposium on Measurement Technology
`and Intelligent Instruments (ISMTII), 29 Jun – 2 July 2011, KAIST, Daejeon, Korea
`15 Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Interferometry for
`picometer-level dimensional stability measurements. CLEO/Europe-EQEC 2011, 21–26 May 2011,
`Munich, Germany
`Ellis JD*, Baas M, Spronck JW. Errors in measurement and compensation algorithms for periodic
`nonlinearity correction. 25th ASPE Annual Meeting, 31 Oct–5 Nov 2010, Atlanta, GA
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`13 Voigt D, Ellis JD, Verlaan A, Spronck JW, Bergmans R, Munnig Schmidt RH. Towards traceable
`metrology for material stability characterization. NanoScale 2010, 27–29 Oct 2010, Brno, Czech
`Republic
`12 Verlaan A*, Ellis JD, Voigt D, Spronck JW, Munnig Schmidt RH. Interferometric system for pm-level
`stability characterization. ISCO 2010, 4–8 Oct 2010, Rhodes Island, Greece
`Joo K, Ellis JD, Buice ES, Spronck JW, Munnig Schmidt RH. A novel heterodyne displacement
`interferometer with no detectable periodic nonlinearity and optical resolution doubling. 10th euspen
`International Conference, 31 May – 3 Jun 2010, Delft, The Netherlands
`Ellis JD, Joo K, Buice ES, Spronck JW, Munnig Schmidt RH. Frequency stabilization and heterodyne
`system via the mixed mode in three mode HeNe lasers. 10th euspen International Conference, 31 May - 3
`Jun 2010, Delft, The Netherlands
`Ellis JD, Joo K, Buice ES, Spronck JW, Munnig Schmidt RH. Magnetic field effects on the secondary
`beat frequency profile for three mode HeNe laser stabilization. 24th ASPE Annual Meeting, 4-9 Oct 2009,
`Monterey, CA
`Ellis JD*, Joo K, Spronck JW, Munnig Schmidt RH. Double-sided interferometer with low drift for
`stability testing, 9th International Symposium on Measurement Technology and Intelligent Instruments
`(ISMTII). 29 Jun – 2 July 2009, St. Petersburg, Russia
`Joo K*, Ellis JD, Spronck JW, van Kan PJM, Munnig Schmidt RH. Simple heterodyne laser
`interferometer without periodic errors, 9th International Symposium on Measurement Technology and
`Intelligent Instruments (ISMTII). 29 Jun – 2 July 2009. St. Petersburg, Russia
`Joo K, Ellis JD, Spronck JW, Munnig Schmidt RH. Wavelength corrected, non-polarizing heterodyne
`laser interferometry in air, 9th euspen International Conference. 2–5 Jun 2009, San Sebastian, Spain
`Ellis JD*, Joo K, Verlaan A, Spronck JW, Munnig Schmidt RH. Uncertainty considerations for
`interferometric stability testing, 23rd ASPE Annual Meeting, 19–23 Oct 2008, Portland, OR USA
`Buice ES, Ellis JD, Langen HH, Munnig Schmidt RH. Importance of metrology in micro-machines, 6th
`International Workshop on Microfactories. 14–19 Oct 2008, Chicago, IL USA
`Ellis JD, Hatzigeorgopoulos JH, Spronck JW, Munnig Schmidt RH. Optically balanced, multi-pass
`displacement interferometry for picometer stability testing, 22nd ASPE Annual Meeting, 14–19 Oct 2007,
`Dallas, TX USA
`Ellis JD, Smith ST, Hocken RJ. Reducing uncertainties in nanoindentation. 7th euspen International
`Conference, 20–24 May 2007, Bremen, Germany; 2007 1:274-277
`Ellis JD, Smith ST, Hocken RJ. An instrument for nanoindentation without frame stiffness
`dependency. 21st ASPE Annual Meeting, 15–20 Oct 2006, Monterey, CA USA
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`PATENTS & I NVENTION DISCLOSURES (AWARDED & SUBMITTED)
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`Brooks DR, Ellis JD. Optical design for a two-degree-of-freedom scanning system with a curved
`sample plane. Invention Disclosure to UR March 19, 2017
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`Ellis JD, Roll CD, Keene AD, Echter MA. Compact, Slope sensitive Optical Probe. US Provisional
`Application 61/859,944, filed July 30, 2013.
`Knox WH, Ellis JD. High numerical aperture optomechanical scanner for layered gradient index
`microlenses, methods, and applications, US Provisional Application 61843553, filed July 8, 2013.
`(currently licensed to Clerio Vision, Inc.)
`Ellis JD, Spronck JW. 9,518,816. Dual beam splitter interferometer measuring 3 degrees of freedom,
`system and method of use, filed November 29, 2012, issued December 13, 2016. (currently licensed to
`InSituTec, Inc.)
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`Ellis JD, Smith ST, Hocken RJ. US7568381 B2. Method and apparatus for surface property
`measurements and profiling indentations with in-process compensation of instrument frame
`distortions, issued August 5, 2009. [www] (currently in licensed to Anton Paar)
`Ellis JD, Joo K, Buice ES, Spronck JW. Frequency stabilized laser. Netherlands application NL 48.182.
`Joo K, Ellis JD, Spronck JW. Laser Interferometer. International application PCT/NL2009/ 050541.
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`PRESENTATIONS
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`Optical Probing for Freeform Optics Metrology
`Invited at MIT Lincoln Laboratory; Wakefield, MA USA
`Dynamic, Multi-DOF Metrology
`Invited at the National Institute for Metrology; Beijing, China
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`Differential Wavefront Sensing and Dynamic Phase Compensation for Piezo Stage Calibration
`Invited at Changchun Institute of Optics, Mechanics, and Physics – CIOMP;
`Changchun, China
`20 Metrology & Instrumentation at the University of Rochester
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`Invited at Huazhong University of Science & Technology – HUST; Wuhan, China
`Eight Part Lecture Series on Metrology, Instrumentation, & Calibration
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`Invited at Tsinghua University; Beijing, China
`18 Metrology & Instrumentation at the University of Rochester
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`Invited at Korea Advanced Institute for Science & Technology – KAIST; Daejong,
`South Korea
`Precision Engineering for Dimensional Metrology
`Invited seminar at the University of Pittsburgh; Pittsburgh, PA USA
`Center for Freeform Optics
`NAVAIR SBIR Review Open Forum; Webster, NY USA
`Flexure Stage for Ophthalmic Applications
`Bausch+Lomb; Rochester, NY USA
`Fiber-Delivered, Multi-DOF Interferometry for Precision Stage Metrology
`Optikos Corporation; Wakefield, MA USA
`Compact, Multi-DOF Interferometry for Precision Stage Metrology
`MIT Lincoln Labs; Lexington, MA USA
`Random Move & Settle Performance Evaluation
`ASME B5/TC52 Committee Meeting; Gaithersburg, MD USA
`Precision Engineering the Future
`Invited at Student Night, ASME Rochester Senior Section; Rochester, NY USA
`Refractive Index Tracking for the NIST Watt Balance
`Invited at NIST; Gaithersburg, MD USA
`Instrumentation, Metrology, & Precision Engineering at UR
`Industrial Associates Meeting at The Institute of Optics; Rochester, NY USA
`Errors in M&C Algorithms for Periodic Error Compensation
`Invited at ASML Netherlands B.V.; Veldhoven, The Netherlands
`TU Delft Interferometric Metrology Developments
`Invited Agilent Technologies Inc.; Santa Clara, CA USA
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`01/25/2016
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`08/2015
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`08/2015
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`08/2015
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`08/2015
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`08/2015
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`03/17/2015
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`01/28/2015
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`06/20/2013
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`04/23/2013
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`04/22/2013
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`03/07/2013
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`02/21/2013
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`12/14/2012
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`10/2011
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`10/25/2010
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`10/09/2009
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`Curriculum Vitæ
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`Optical Metrology Techniques
`Course Lecture at Delft University of Technology; Delft, The Netherlands
`Interferometry for Measuring Dimensional Stability
`Invited at TNO Science & Industry; Delft, The Netherlands
`Challenge the Future
`Recruiting at the Intermediair PhD Career Event; Amsterdam, The Netherlands
`Instrumentation for Material Stability Testing
`Invited at Massachusetts Institute of Technology; Cambridge, MA USA
`Reducing Frame Stiffness Dependency in Nanoindentation
`Invited at Eindhoven University of Technology; Eindhoven, The Netherlands
`1 Mechanism for Helicopter Active Flap Control
`ASME Student Competition at Duke University; Durham, NC USA
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`06/09/2009
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`04/20/2009
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`04/16/2008
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`02/01/2008
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`11/2007
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`10/2005
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`PRESS & MISCELLANEOUS PUBLICATIONS
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`Guest on The Amp Hour: Episode 283, 22 Jan 2016 [www]
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`6 UR center makes the photonic match. Democrat & Chronicle, November 2, 2015 [www]
`5
`A Rochester-Based Revolution in Laser Vision Correction? Democrat & Chronicle, September 17, 2015
`[www]
`4 Weighty Matters. Rochester Review, July-August 2015
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`Savage DE, Brooks DR, DeMagistris M, Ellis JD, Knox WH, Huxlin KR. Refractive index shaping in live
`cat cornea in-vivo. CEIS Poster Showcase, 11 April 2014 (Best Poster Award)
`2 Mirhosseini M, Magaña-Loaiza OS, Gillmer SR, Malik M, Ellis JD, Boyd RW. Amplification of optical
`time delays using weak measurements. Coherence and Quantum Optics, Poster Presentation, 17–19
`Jun 2013, Rochester, NY USA
`Ellis JD, Spotlight on Optics, Comments on Precision absolute positional measurement of laser beams,
`April 2013
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`FUNDING
`EXTRAMURAL RESEARCH FUNDING: $4,579,134
`Approximate Yearly Funding Rate: $760,000
`Funding Success Rate: 44% (25 of 57**, 2 pending)
`NSF CAREER - $500,000
`
`Role: PI
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`CAREER: Breaking the freeform optics metrology barrier with synthetic wavelength interferometry
`CeFO - $165,045
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`Role: PI
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`Multi-Wavelength Interferometry for Freeform Surface Metrology
`CEIS - $120,000
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`Role: PI with PIs Knox, Huxlin, & Funkenbusch
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`Pathway towards in-vivo LIRIC: Visual Acuity of Clinically Relevant Refractive Correctors using LIRIC
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`(Matching funds secured for Clerio Project from NY State)
`NSF STTR - $134,313
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`Role: Senior Personnel (wrote & coordinated the proposal)
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`03/01/2017 - 02/28/2022
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`06/01/2017 - 05/31/2020
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`07/01/2016 - 06/30/2017
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` 11/01/2015 - 04/30/2016
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`Curriculum Vitæ
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`Jonathan D. Ellis
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`STTR Phase I: Re