`Trials@uspto.gov
`571-272-7822 Entered: June 23, 2017
`
`
`
`
`UNITED STATES PATENT AND TRADEMARK OFFICE
`____________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`____________
`
`NVIDIA CORPORATION,
`Petitioner,
`
`v.
`
`POLARIS INNOVATIONS LIMITED,
`Patent Owner.
`____________
`
`Case IPR2017-00382
`Patent 7,124,325 B2
`____________
`
`
`
`Before SALLY C. MEDLEY, BARBARA A. PARVIS, and
`WILLIAM M. FINK, Administrative Patent Judges.
`
`PARVIS, Administrative Patent Judge.
`
`
`
`
`DECISION
`Denying Institution of Inter Partes Review
`37 C.F.R. § 42.108
`
`
`
`
`
`
`
`
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`IPR2017-00382
`Patent 7,124,325 B2
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`I. INTRODUCTION
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`NVIDIA Corporation (“Petitioner”) filed a Petition for inter partes
`
`review of claims 1–20 (“the challenged claims”) of U.S. Patent No.
`
`7,124,325 B2 (Ex. 1001, “the ’325 Patent”). Paper 2 (“Pet.”). Polaris
`
`Innovations Limited (“Patent Owner”) filed a Preliminary Response. Paper
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`7 (“Prelim. Resp.”).
`
`We apply the standard set forth in 35 U.S.C. § 314(a), which requires
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`demonstration of “a reasonable likelihood that the petitioner would prevail
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`with respect to at least 1 of the claims challenged in the petition.” Upon
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`consideration of the Petition and Preliminary Response, we conclude the
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`information presented does not show there is a reasonable likelihood that
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`Petitioner would prevail in establishing the unpatentability of the challenged
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`claims of the ’325 Patent. Accordingly, we do not institute an inter partes
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`review.
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`A.
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`Related Matters
`
`The parties state that the ’325 Patent is the subject of a pending
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`lawsuit that includes assertions against Petitioner. Pet. 93; Paper 4 (“Patent
`
`Owner’s Initial Mandatory Notices”), 2–3. Patent Owner identifies a lawsuit
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`pending in the Northern District of California, i.e., Polaris Innovations Ltd.
`
`v. Dell Inc., Case No. 4:16–cv-07005 (N.D. Cal.).1 Patent Owner’s Initial
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`Mandatory Notices, 2–3.
`
`
`
`1 This lawsuit is referred to herein as the “companion district court lawsuit.”
`The companion district court lawsuit was transferred from the United States
`District Court for the Western District of Texas on December 5, 2016. Id.
`That case was Polaris Innovations Ltd. v. Dell Inc., Case No. 5:16–cv-00451
`(W.D. Tex). Pet. 93; Patent Owner’s Initial Mandatory Notices, 2.
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`2
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`IPR2017-00382
`Patent 7,124,325 B2
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`B. The ’325 Patent
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`The ʼ325 Patent is directed to trimming interface devices on
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`semiconductor devices. Ex. 1001, 1:10-12. Figure 3 of the ’325 Patent is
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`reproduced below.
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`Figure 3 illustrates a schematic diagram of a configuration for
`trimming interface devices in a semiconductor device.
`
`As shown in Figure 3 above, semiconductor device 1 includes
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`
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`trimming unit 5 that is connected to interface devices 10a–10d in a driver
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`device. Id. at 7:61–8:6. Trimming unit 5 is connected to test control unit 24
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`3
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`Patent 7,124,325 B2
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`in test apparatus 2. Id. at 8:8–9. Control path 34 connects test apparatus 2 to
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`trimming register 14. Id. at 8:10–11.
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`C. Illustrative Claim
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`Petitioner challenges claims 1–20 of the ’325 Patent. Pet. 1. Claims 1
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`and 14 are independent claims. Claims 2–13 and 15–20 depend, directly or
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`indirectly, from claims 1 or 14. Independent claim 1, reproduced below, is
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`illustrative of the claimed subject matter:
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`1. A method for trimming interface devices, which comprises:
`
`providing a semiconductor device having a plurality of interface
`devices and providing each one of the plurality of interface
`devices with a settable control element;
`
`providing a test apparatus having a current source;
`
`connecting the current source in the test apparatus to an interface
`connection on the semiconductor device, the interface
`connection being connected to one of the plurality of interface
`devices;
`
`controlling a measurement current produced by the current
`source and setting the control element of the one of the
`plurality of interface devices to an initial value;
`
`providing a trimming unit in the semiconductor device;
`
`using the trimming unit to acquire a measurement voltage
`produced by the measurement current in the one of the
`plurality of interface devices;
`
`using the trimming unit to compare the measurement voltage
`with a nominal voltage;
`
`based on a difference between the measurement voltage and the
`nominal voltage, setting the control element of the one of the
`plurality of interface devices to a trimming value at which the
`measurement voltage matches the nominal voltage; and
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`acquiring the trimming value for the control element of the one
`of the plurality of interface devices.
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`Patent 7,124,325 B2
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`Id. at 8:66–9:24.
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`D. Asserted Grounds of Unpatentability
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`Petitioner asserts that claims 1–20 are unpatentable, under 35
`
`U.S.C. § 103(a), based on the following grounds (Pet. 1):
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`References
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`Challenged Claims
`
`Tanaka2 and Ikehashi3
`Garrett4 and Hassoun5
`Garrett, Hassoun, and Ishikawa6
`
`1–20
`
`1, 8–14, 16, and 17
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`2–7, 15, and 18–20
`
`As support, Petitioner proffers a Declaration of Dr. Nick Tredennick,
`
`who has been retained by Petitioner for the instant proceeding.
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`Ex. 1002 ¶ 1–3.
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`II. DISCUSSION
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`A.
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`Claim Construction
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`Petitioner contends “[u]nder the broadest reasonable construction,
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`Petitioner does not submit that any claim terms require a construction at this
`
`time.” Pet. 7. Patent Owner provides proposed constructions for “interface
`
`device,” “trimming,” “DRAM,” “DDRII,” and “settable control element.”
`
`Prelim. Resp. 11–23.
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`
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`2 U.S. Patent No. 7,000,160 B2, issued Feb. 14, 2006 (Ex. 1003) (“Tanaka”).
`3 U.S. Patent No. 6,643,180 B2, issued Nov. 4, 2003 (Ex. 1004)
`(“Ikehashi”).
`4 U.S. Patent No. 6,556,052 B2, issued Apr. 29, 2003 (Ex. 1005) (“Garrett”).
`5 U.S. Patent No. 5,844,913, issued Dec. 1, 1998, (Ex. 1006) (“Hassoun”).
`6 U.S. Patent No. 5,991,221, issued Nov. 23, 1999 (Ex. 1007) (“Ishikawa”).
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`5
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`Patent 7,124,325 B2
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`We address the Patent Owner’s contentions regarding the broadest
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`reasonable interpretation of “interface device” below. For purposes of this
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`Decision, we rely on Patent Owner’s representations that “DRAM” is an
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`acronym for “dynamic random access memory” and “DDR” is an acronym
`
`for “double data rate.” Prelim. Resp. 20. We determine no other term
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`requires express interpretation for purposes of this Decision. See Wellman,
`
`Inc. v. Eastman Chem. Co., 642 F.3d 1355, 1361 (Fed. Cir. 2011) (“[C]laim
`
`terms need only be construed ‘to the extent necessary to resolve the
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`controversy’”) (quoting Vivid Techs., Inc. v. Am. Sci. & Eng’g, Inc., 200
`
`F.3d 795, 803 (Fed. Cir. 1999)).
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`1.
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`Principles of Law
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`In an inter partes review, we construe claim terms in an unexpired
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`patent according to their broadest reasonable construction in light of the
`
`specification of the patent in which they appear. 37 C.F.R. § 42.100(b).
`
`Consistent with the broadest reasonable construction, claim terms are
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`presumed to have their ordinary and customary meaning as understood by a
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`person of ordinary skill in the art in the context of the entire patent
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`disclosure. In re Translogic Tech., Inc., 504 F.3d 1249, 1257 (Fed. Cir.
`
`2007).
`
`2.
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`“interface device”
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`We turn to the broadest reasonable interpretation of “interface
`
`device,” recited in independent claim 14 and “interface devices,” recited in
`
`independent claim 1. The disputes between the parties regarding the
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`teachings of the asserted art pertain to the meaning of “interface” and
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`whether “one of the plurality of interface devices,” recited in claim 1, and
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`Patent 7,124,325 B2
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`“said interface device,” recited in claim 14, pertain to one of the interface
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`devices. The disputes between the parties, however, do not hinge on the
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`meaning of “device” or “devices.”
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`With respect to the dispute pertaining to “interface,” Patent Owner
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`characterizes the trimming identified by Petitioner in its element-by-element
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`unpatentability analysis as being “deep within a memory device” (Prelim.
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`Resp. 1), whereas “the ‘interface device’ is associated with an interface
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`between the semiconductor device and something external to the
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`semiconductor device” (id. at 14). With respect to whether “one of the
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`plurality of interface devices,” recited in claim 1 and “said interface device,”
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`recited in claim 14, pertain to one of the interface devices, Patent Owner
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`contends a measurement identified by Petitioner is “between two alleged
`
`interface devices,” rather than “on the identified interface device,” as recited,
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`for example, in claim 14. Id. at 55.
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`We turn to Patent Owner’s contentions regarding “interface.” Id. at
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`11–20. Patent Owner argues, with supporting evidence, that a person having
`
`ordinary skill in the art at the time of the invention would have understood
`
`that “the relevant ‘interface’ is between the semiconductor device, on one
`
`hand, and another device external to the semiconductor device, on the other
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`hand.” Id. at 17 (citing Ex. 2001 (defining “interface” as “electronic
`
`circuitry used to connect two or more devices”); Ex. 2002 (defining
`
`“interface” as a “connection between two hardware devices”); Ex. 2003
`
`(defining “interface as “[a] device or software program that connects two
`
`separate entities.”)). Patent Owner also argues that the ’325 Patent
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`Specification describes “interface devices” consistent with this ordinary
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`meaning, for example, by depicting interface devices 10a–10d at the
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`Patent 7,124,325 B2
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`external boundary of semiconductor device 1 and describing output drivers
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`and terminations as examples of interface devices. Id. at 15–17 (citing Ex.
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`1001, [54], [57], 1:36–62, 3:18–21, 5:24–27, 6:27–34, 6:66–7:12, Figs. 1–3).
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`Petitioner contends that no claim terms require express construction at
`
`this time. Pet. 7. However, in its overview of the ’325 Patent, Petitioner
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`acknowledges that output drivers and terminations are exemplary “interface
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`devices” contending “[i]nterface devices, like output drivers and
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`terminations [ ], have parameters that affect reading and writing from a data
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`bus.” Id. at 3 (citing Ex. 1001, 1:36–41, 3:18–21). Additionally, Dr.
`
`Tredennick testifies that “interface devices include output drivers and
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`terminations.” Ex. 1002 ¶ 16.
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`Consistent with Patent Owner’s contentions (Prelim. Resp. 15–17),
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`the ’325 Patent describes that “[i]t is accordingly an object of the invention
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`to provide a semiconductor device and a method for trimming interface
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`devices of the semiconductor device, which overcome the above-mentioned
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`disadvantages of the prior art” (id. at 3:13–16) and describes as background
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`“[f]or ordinary DDRII memory systems, it is normally not possible to trim
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`the interface parameters” (id. at 2:18–19). Also, the ’325 Patent is entitled
`
`“METHOD AND APPARATUS FOR INTERNALLY TRIMMING
`
`OUTPUT DRIVERS AND TERMINATIONS IN SEMICONDUCTOR
`
`DEVICES.” Id. at [54] (emphasis added). Additionally, as acknowledged
`
`by Petitioner (Pet. 3; Ex. 1002 ¶ 16), the ’325 Patent Specification describes
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`“[t]wo of the interface devices are output driver devices 10a, 10b” and “[t]he
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`two other interface devices are termination devices 10c, 10d.” Ex. 1001,
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`6:64–67. Furthermore, according to the ’325 Patent Specification, an
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`interface device is connected to an interface connection (id. at 3:37–38, Figs.
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`8
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`1–3), which is in the form of a contact area (id. at 7:48–49) and interface
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`devices are illustrated at the external boundary of the semiconductor device
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`(see, e.g., id. at Fig. 3). Given the specification’s consistent usage of the
`
`term “interface device,” we are persuaded by Patent Owner’s contentions
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`regarding “interface.”
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`We now turn to Patent Owner’s contention regarding whether “one of
`
`the plurality of interface devices,” recited in claim 1, and “said interface
`
`device,” recited in claim 14, pertain to one of the interface devices. Prelim.
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`Resp. 55. Claim 1 recites acquiring “a measurement voltage produced by
`
`the measurement current in the one of the plurality of interface devices,”
`
`which is used to set a trimming value. Ex. 1001, 9:13–22. Claim 14 recites
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`“writing to said trimming register based on a measured variable detected on
`
`said interface device.” Id. at 10:30–32. Patent Owner’s contention (Prelim.
`
`Resp. 55) is consistent with the portions of the ’325 Patent Specification
`
`discussed above because performing the measurement with respect to one
`
`interface device is a prerequisite for trimming that interface device.
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`Additionally, Patent Owner’s contention is consistent with other
`
`descriptions in the ’325 Patent Specification. For example, the ’325 Patent
`
`Specification describes that “trimming unit 5 is switchably connected to
`
`each driver device which is to be trimmed” (Ex. 1001, 7:64–65) and “[o]ne
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`of the interface devices 10a–10d is now trimmed by taking the measurement
`
`voltage” (id. at 8:12–13). In addition to not providing proposed
`
`constructions for any claim terms, Petitioner does not offer guidance,
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`explicitly or implicitly, as to how these phrases should be interpreted, other
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`than to identify the specific examples set forth above.
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`On this record, we are persuaded by Patent Owner’s contentions that
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`the broadest reasonable interpretation of “interface” in the context of the
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`’325 Patent Specification is “between the semiconductor device” and
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`“another device external to the semiconductor device” (Prelim. Resp. 17)
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`and “interface device” is “associated with an interface” (id. at 14). We
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`further are persuaded that “one of the plurality of interface devices,” recited
`
`in claim 1, and “said interface device,” recited in claim 14, pertain to one of
`
`the interface devices. Patent Owner proffers alternate interpretations of the
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`term “interface devices.” Prelim. Resp. 18–20. As the aforementioned
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`determinations are sufficient to resolve the disputes between the parties, we
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`need not construe expressly other terms for purposes of this Decision.
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`B.
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`Principles of Law (Obviousness)
`
`A patent claim is unpatentable under 35 U.S.C. § 103(a) if the
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`differences between the claimed subject matter and the prior art are such that
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`the subject matter, as a whole, would have been obvious at the time the
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`invention was made to a person having ordinary skill in the art to which said
`
`subject matter pertains. KSR Int’l Co. v. Teleflex Inc., 550 U.S. 398, 406
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`(2007). The question of obviousness is resolved on the basis of underlying
`
`factual determinations, including: (1) the scope and content of the prior art;
`
`(2) any differences between the claimed subject matter and the prior art;
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`(3) the level of skill in the art; and (4) objective evidence of nonobviousness,
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`i.e., secondary considerations. Graham v. John Deere Co., 383 U.S. 1, 17–
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`18 (1966).
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`C.
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`Person of Ordinary Skill in the Art
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`Petitioner proposes that a person of ordinary skill in the art would
`
`have had a Bachelor’s degree in Electrical Engineering and at least 2 years
`
`of experience working in the field of semiconductor logic design. Ex.
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`1002 ¶ 13. Patent Owner does not dispute Petitioner’s proposal. See
`
`generally Prelim. Resp. For purposes of this Decision, we adopt Petitioner’s
`
`assessment of the level of ordinary skill in the art.
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`D. Obviousness over Tanaka and Ikehashi (Claims 1–20)
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`Petitioner contends each of claims 1–20 is unpatentable, under 35
`
`U.S.C. § 103(a), over the combined teachings of Tanaka and Ikehashi.
`
`1.
`
`Overview of Tanaka
`
`Tanaka is directed to trimming techniques for semiconductor
`
`integrated circuits. Ex. 1003, 1:5–8. Tanaka teaches a circuit configuration
`
`for voltage trimming (id. at 10:51–52) as well as a modified configuration
`
`for circuit trimming (id. at 12:57–60).
`
`2.
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`Overview of Ikehashi
`
`Ikehashi is directed to a method of testing a semiconductor memory.
`
`Ex. 1004, [57]. Ikehashi teaches trimming voltages generated by an internal
`
`voltage generator circuit. Id. at 11:7–10. More specifically, Ikehashi
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`teaches trimming a reference voltage Vref, an internal fall voltage Vdd, and
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`a non-selected cell work line voltage Vread. Id. at 11:7–12.
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`3.
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`Discussion of Claim 1
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`We begin our analysis with independent claim 1. Claim 1 is directed
`
`to a method for trimming interface devices of a semiconductor device
`
`comprising nine steps. Ex. 1001, 8:66–9:12. The method of claim 1
`
`requires connecting a current source in a test apparatus to one of the
`
`interface devices, controlling a measurement current produced by the current
`
`source, and setting a control element of the interface device to an initial
`
`value. Id. at 9:4–11. The method of claim 1 additionally requires using a
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`trimming unit in the semiconductor device to acquire a measurement
`
`voltage, performing a comparison with that measurement voltage, and, based
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`on that comparison, setting the control element of the interface device to a
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`trimming value. Id. at 9:12–22. Petitioner’s contentions are deficient for
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`two reasons: (1) the Petition does not show sufficiently how or why a
`
`person having ordinary skill in the art would have combined or modified the
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`teachings identified in Tanaka and Ikehashi in the manner recited in claim 1;
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`and (2) the Petition does not show sufficiently that the combination of
`
`Tanaka and Ikehashi teaches “interface devices,” as recited in claim 1.
`
`Turning to the first deficiency, claim 1 recites nine method steps. For
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`three of these steps, Petitioner points to Tanaka’s teachings relating to
`
`current trimming. Pet. 31–33 (citing Ex. 1003, 13:2–5, 13:6–17, 19:6–9,
`
`Fig. 12). For the remaining method steps recited in claim 1, Petitioner
`
`points to Tanaka’s or, alternatively, Ikehashi’s teachings relating to voltage
`
`trimming. Pet. 37–43 (citing Ex. 1003, 10:58–11:12, 11:27–57, Fig. 4; Ex.
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`1004, 16:11–24, 15:47–50, 16:11–20, Fig. 16).
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`Petitioner provides insufficient explanation as to how or why a person
`
`having ordinary skill in the art would have combined or modified the
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`12
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`teachings relating to current trimming and those relating to voltage
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`trimming. Although Petitioner relies on teachings of Tanaka for both
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`current trimming and voltage trimming, these teachings relate to two
`
`separate, alternative embodiments. More specifically, Tanaka teaches that
`
`Figure 4 “shows an example of a circuit configuration for voltage
`
`trimming,” (Ex. 1003, 10:51–52), whereas Figure 12 shows “another
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`modification of the arrangement shown in FIG. 4” for “current trimming”
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`(id. at 12:57–60).
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`Petitioner’s explanation regarding the combination of Tanaka’s
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`current and voltage trimming embodiments is set forth below.
`
`Although Figure 12 relates to an embodiment showing
`“circuit trimming” rather than voltage trimming, Tanaka states
`that “[t]he same trimming procedure as that in the case of the
`arrangement shown in Fig. 4 [for voltage trimming] is used to
`obtain the same effect.” Ex. 1003, 12:57–13:19; see also id.,
`19:6–9. Thus, to the extent Patent Owner argues that Figures 4
`and 12 (and related disclosures) are directed to different
`embodiments within Tanaka, Petitioner submits that Fig. 12
`integrates and thus discloses this aspect of Fig. 4, and Petitioner
`alternatively submits that it would have been obvious to a
`POSITA to combine this aspect of Fig. 4 into Fig. 12, given the
`referenced equivalence. Ex. 1002 ¶¶ 61–62.
`
`Pet. 33, n. 4 (emphasis added).
`
`Petitioner’s reliance on Tanaka’s statement that “[t]he same trimming
`
`procedure as that in the case of the arrangement shown in Fig. 4” (id.) is
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`misplaced because it pertains to teachings not relied on by Petitioner. More
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`specifically, Petitioner points to Tanaka’s Figure 4 teachings for using the
`
`trimming unit to arrive at a trimming value. See, e.g., Pet. 37–43 (citing Ex.
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`1003, 10:58–11:12, 11:27–57). Tanaka’s statement that “[t]he same
`
`trimming procedure as that in the case of the arrangement shown in Fig. 4 is
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`used to obtain the same effect” (Ex. 1003, 13:17–19) pertains to CPU
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`functions performed after the trimming value is obtained (id. at 11:16–21).
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`Regarding Petitioner’s contention that “Fig. 12 integrates and thus
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`discloses this aspect of Fig. 4, and Petitioner alternatively submits that it
`
`would have been obvious to a POSITA to combine this aspect of Fig. 4 into
`
`Fig. 12,” and to the extent that Petitioner contends something other than the
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`CPU procedure is integrated, the Petition is too vague as to what aspect of
`
`Figure 4 Petitioner contends is integrated with Figure 12. We, therefore, are
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`not persuaded that Tanaka discloses the steps recited in claim 1, in the
`
`manner claimed. Petitioner’s alternative submission that the integration
`
`would have been obvious relies on the same statement of Tanaka discussed
`
`above and is not persuasive for the same reasons. We, therefore, are not
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`persuaded by Petitioner that Tanaka teaches or suggests the elements recited
`
`in claim 1 and, because Petitioner does not offer further persuasive
`
`explanation regarding why or how these embodiments would have been
`
`combined or modified by a person of ordinary skill in the art, we also are not
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`persuaded by Petitioner’s obviousness contention.
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`Regarding Petitioner’s remaining contentions, including those relating
`
`to Ikehashi, we agree with Patent Owner’s contention that “Challenge 1 is
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`two anticipation challenges improperly paired together and presented as a
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`single obviousness challenge.” Prelim. Resp. 1. For instance, Petitioner’s
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`identification of teachings relating to Tanaka’s Figure 4 and, alternatively,
`
`Ikehashi’s Figure 16 with respect to method steps pertaining to using the
`
`trimming unit to arrive at a trimming value, are presented as two alternative
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`grounds, one based on Tanaka and the other based on Ikehashi. Petitioner,
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`however, points to only Tanaka’s teachings relating to Figure 12 for the
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`method steps of connecting a current source in a test apparatus to one of the
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`interface devices and controlling a measurement current produced by the
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`current source, recited in claim 1. Pet. 31–33 (citing Ex. 1003, 13:2–5,
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`13:6–17, 19:6–9, Fig. 12). Petitioner does not provide sufficient explanation
`
`as to how or why a person having ordinary skill in the art would have
`
`combined or modified Tanaka’s teachings relating to current trimming with
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`any of the teachings relating to voltage trimming.
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`“An invention is not obvious just ‘because all of the elements that
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`comprise the invention were known in the prior art;’ rather, a finding of
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`obviousness at the time of invention requires a plausible rational[e] as to
`
`why the prior art references would have worked together.” Broadcom Corp.
`
`v. Emulex Corp., 732 F.3d 1325, 1335 (Fed. Cir. 2013) (emphasis added).
`
`Citing to two embodiments in the same reference does not explain how or
`
`why a person having ordinary skill in the art would have combined the
`
`teachings relating to those two embodiments. See, e.g., Jacket Int’l Ltd. v.
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`Admar Int’l Ltd., Case IPR2015-00979 (PTAB May 20, 2016) (Paper 21).
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`We now turn to the second deficiency, i.e., the Petition does not show
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`sufficiently that the combination of Tanaka and Ikehashi teaches “interface
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`devices,” as recited in claim 1. Petitioner contends Tanaka and Ikehashi
`
`disclose alternative interface devices. Pet. 11–16, 31.
`
`Regarding Tanaka, Petitioner contends “[t]he disclosed interface
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`device comprises timing controller 50 and boosting circuit 6 (items 60–66 in
`
`Fig. 4).” Id. at 12. Petitioner also contends that flash memory chip 5A
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`contains timing controller 50 that generates operating voltages such as write
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`voltage and erase voltage. Id. at 11 (citing Ex. 1003, 17:23–36).
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`Alternatively, Petitioner contends “Ikehashi discloses that the
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`semiconductor has a plurality of interface devices, for example, Figure 1
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`shows control logic that manages buffers and registers in order to read from
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`and write to memory.” Pet. 13–14 (citing Ex. 1004, 8:60–10:18, Fig. 1).
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`Petitioner also contends “[t]he interface device also includes part of voltage
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`generator circuit 20, which ‘generates a variety of voltages for use in
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`chips.’” Id. at 14 (citing Ex. 1004, 9:51–56).
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`The components identified by Petitioner (id. at 11–14) in both Tanaka
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`and Ikehashi are involved in timing and voltage boosting or generation for
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`reading from and writing to internal memory. See, e.g., Ex. 1003, 17:14–17
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`(“The flash memory chip 5A has a boosting circuit 6A and a trimming
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`circuit 7A. The boosting circuit 6A generates a high voltage Vpp necessary
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`for write and erase and supplies the high voltage Vpp to a timing controller
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`(TCNT) 50.”); Ex. 1004, 9:51–62 (“An internal voltage generator circuit 20
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`generates a variety for voltages for use in chips . . . A timer circuit 22
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`generates a variety of timing pulses used when a variety of voltages are
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`generated.”). However, we determine that the Petition lacks a requisite
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`showing that these components are associated with an interface under the
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`broadest reasonable interpretation of that term, which as discussed above is
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`“between the semiconductor device and another device external to the
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`semiconductor device.”
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`Accordingly, we determine that Petitioner has not shown sufficiently
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`that either Tanaka or Ikehashi teaches the interface devices recited in claim
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`1. Petitioner also does not propose a combination of Tanaka and Ikehashi
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`teachings with respect to “a plurality of interface devices,” recited in claim
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`1.
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`For the reasons given, we determine that Petitioner has not shown
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`sufficient basis for instituting trial on the ground that claim 1 is
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`unpatentable, under 35 U.S.C. § 103(a), over Tanaka and Ikehashi.
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`4.
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`Discussion of Independent Claim 14
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`Independent claim 14 is similar to claim 1 in that it recites a
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`semiconductor device comprising at least one interface device and a
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`trimming unit, connected to the interface device, for writing to a trimming
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`register based on a variable detected on the interface device. Ex. 1001,
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`10:26–34. In its contentions for “interface devices” recited in claim 1,
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`Petitioner references back to its contentions for claim 14. Pet. 31 (citing Pet.
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`11–16).
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`As discussed above, the Petition does not show sufficiently that the
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`combination of Tanaka and Ikehashi teaches “interface devices,” as recited
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`in claim 1. For the same reasons, the Petitioner does not show sufficiently
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`that the combination of Tanaka and Ikehashi teaches “interface device,” as
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`recited in claim 14. The Petition does not include further contentions for
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`claim 14 that remedy the deficiencies noted above.
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`For the reasons given, we determine that Petitioner has not shown
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`sufficient basis for instituting trial on the ground that claim 14 is
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`unpatentable, under 35 U.S.C. § 103(a), over Tanaka and Ikehashi.
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`5.
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`Discussion of Dependent Claims 2–13 and 15–20
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`Each of claims 2–13 and 15–20 depends, directly or indirectly, from
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`claim 1 or claim 14. Petitioner does not provide for these claims any
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`argument or evidence overcoming the deficiency we note above for claims 1
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`and 14. Pet. 28–30, 44–56. For the reasons given, we determine that
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`Petitioner has not shown sufficient basis for instituting trial on the ground
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`that claims 2–13 and 15–20 are unpatentable, under 35 U.S.C. § 103(a), over
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`Tanaka and Ikehashi.
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`6.
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`Conclusion
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`Having reviewed the Petition and Preliminary Response, and the
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`evidence cited therein, we are not persuaded that Petitioner has established a
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`reasonable likelihood that it would prevail in showing that claims 1–20 are
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`unpatentable, under 35 U.S.C. § 103(a), over Tanaka and Ikehashi.
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`E. Obviousness over Garrett and Hassoun
`(Claims 1, 8–14, 16, and 17)
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`Petitioner contends claims 1, 8–14, 16, and 17 are unpatentable, under
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`35 U.S.C. § 103(a), as obvious over the combined teachings of Garrett and
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`Hassoun. Pet. 1.
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`1. Overview of Garrett
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`Garrett is directed to a semiconductor controller device to control the
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`operation of a semiconductor memory device. Ex. 1005, [57]. Garrett
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`teaches a current control technique for interfacing with DRAMs. Id. at
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`2:61–64.
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`2.
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`Overview of Hassoun
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`Hassoun is directed to a test device for an integrated circuit. Ex. 1006,
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`[57]. Hassoun teaches a variable current source with a control input that
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`provides a test signal. Id. at 4:34–37.
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`3.
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`Discussion of Claim 1
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`We begin our analysis with claim 1. Petitioner’s contentions are
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`deficient for two reasons: (1) the Petition does not show sufficiently how or
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`why a person having ordinary skill in the art would have combined or
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`modified the teachings identified in Garrett and Hassoun; and (2) the
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`Petition does not show sufficiently that the combination of Garrett and
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`Hassoun teaches “using the trimming unit to acquire a measurement voltage
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`produced by the measurement current in the one of the plurality of interface
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`devices,” as recited in claim 1.
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`Turning to the first deficiency, as discussed above, claim 1 is directed
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`to a method for trimming interface devices of a semiconductor device
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`comprising nine steps, including steps requiring controlling a measurement
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`current produced by a current source in a test apparatus to set initial
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`parameters and steps of using a trimming unit to arrive at a trimming value.
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`Ex. 1001, 8:66–9:12. Petitioner relies on only Garrett’s teachings for most
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`of the limitations of claim 1, except for steps involving the test apparatus
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`having a current source. Pet. 67–77. For the test apparatus having a current
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`source, Petitioner points to teachings of Garrett and Hassoun. Id. at 68–72.
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`First as to Garrett, we are not persuaded that that claim 1 would have
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`been obvious to one having ordinary skill in the art over the teachings of
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`Garrett alone. For instance, we are not persuaded that Petitioner has shown
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`sufficiently that Garrett teaches a test apparatus having a current source.
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`Petitioner contends “Garrett discloses a test apparatus having a current
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`source” because “[a] POSITA would have understood that disclosure of a
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`reference voltage from an external source, like a test apparatus, discloses a
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`current source in the external test apparatus, because a current source is
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`commonly used in forming reference voltages for test purposes.” Pet. 68
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`(citing Ex. 1005, 13:1–3, 14:27–29, 8:10–11; Ex. 1002 ¶¶ 110–11). In the
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`portions of Garrett identified by Petitioner (id.), however, Garrett does not
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`specifically refer to a test apparatus or a current source. Instead, Garrett
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`teaches providing a reference voltage from an external source (Ex. 1005,
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`13:1–3, 14:27–29), such as “a band-gap reference circuit, or a voltage
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`divider or another voltage supply” (id. at 8:10–13). Dr. Tredennick testifies
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`that such a test apparatus having a current source would have been “well-
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`known in the art,” but does not provide sufficient explanation or supporting
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`evidence as to why Garrett alone teaches the test apparatus having a current
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`source. Ex. 1002 ¶¶ 110–11 (Ex. 1005, 13:1–3, 14:27–29, 8:10–11; Ex.
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`1006, 1:7–10, 4:34–37). Based on the record before us, we are not
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`persuaded that Dr. Tredennick’s testimony remedies the deficiency of the
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`teachings of Garrett alone.
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`In contrast, consistent with Petitioner’s contentions (Pet. 68 (citing
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`Ex. 1006, 4:34–37; Fig. 3)), Hassoun teaches that Figure 3 illustrates a
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`schematic “of an interface circuit for a test device” (Ex. 1006, 3:22–24)
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`having “variable current source 44” (id. at 34). The Petition, however,