throbber
Trials@uspto.gov
`571-272-7822
`
`
`Paper No. 7
`Entered: August 28, 2018
`
`
`UNITED STATES PATENT AND TRADEMARK OFFICE
`____________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`____________
`
`NIKON CORPORATION,
`Petitioner,
`
`v.
`
`ASML NETHERLANDS B.V.
`CARL ZEISS AG,
`Patent Owner.
`____________
`
`Case IPR2018-00687
`Patent 6,731,335 B1
`____________
`
`
`Before JEFFREY S. SMITH, DAVID C. MCKONE, and
`KEVIN W. CHERRY, Administrative Patent Judges.
`
`MCKONE, Administrative Patent Judge.
`
`
`
`
`DECISION
`Institution of Inter Partes Review
`37 C.F.R. § 42.108
`
`
`
`
`
`

`

`IPR2018-00687
`Patent 6,731,335 B1
`
`
`I. INTRODUCTION
`
`A. Background
`Nikon Corporation (“Petitioner”) filed a Petition (Paper 2, “Pet.”) to
`institute an inter partes review of claims 1–12 of U.S. Patent No. 6,731,335
`B1 (Ex. 1001, “the ’335 patent”). Petitioner indicates that Sendai Nikon
`Corporation, Nikon Inc., and Nikon Americas Inc. are real parties in interest.
`Pet. 4. Carl Zeiss AG and ASML Netherlands B.V. (collectively, “Patent
`Owner”) filed a Preliminary Response (Paper 6, “Prelim. Resp.”). Upon
`consideration of the Petition and Preliminary Response, we conclude, under
`35 U.S.C. § 314(a), that Petitioner has established a reasonable likelihood
`that it would prevail with respect to at least one challenged claim.
`Accordingly, we institute an inter partes review of claims 1–12 of the ’335
`patent.
`
`B. Related Matter
`The parties indicate that the ’335 patent has been asserted in Carl
`Zeiss AG v. Nikon Corp., Case No. Case No. 2:17-cv-03221 RGK (MRWx).
`Pet. 4; Paper 4, 2.
`
`
`C. Evidence Relied Upon
`Petitioner relies on the following prior art:
`Ex. 1006 (“Takahashi”) EP 0 757 476 A2
`Ex. 1007 (“Gowda”)
`US 6,115,066
`Ex. 1008 (“Dickinson”) EP 0 707 417 A2
`Ex. 1009 (“Matsunaga”) US 7,113,213 B2
`
`
`
`
`
`
`Feb. 5, 1997
`Sept. 5, 2000
`Apr. 17, 1996
`Sept. 26, 2006
`
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`Patent 6,731,335 B1
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`Petitioner also relies on the Declaration of Stuart Kleinfelder, Ph.D.
`
`(Ex. 1002, “Kleinfelder Decl.”).
`
`
`D. The Asserted Grounds
`Petitioner asserts the following grounds of unpatentability (Pet. 17–
`
`18):
`
`Reference(s)
`Takahashi
`
`Takahashi and Gowda
`
`Takahashi and Dickinson
`Takahashi, Dickinson, and
`Gowda
`Matsunaga
`
`Matsunaga and Gowda
`
`Basis
`§ 103(a)
`
`Claims Challenged
`1–5, 7, 9, and 11
`
`§ 103(a)
`
`§ 103(a)
`
`§ 103(a)
`
`§ 103(a)
`
`§ 103(a)
`
`6, 8, 10, and 12
`
`1–5, 7, 9, and 11
`
`6, 8, 10, and 12
`
`1–5, 7, 9, and 11
`
`6, 8, 10, and 12
`
`1–5, 7, 9, and 11
`
`6, 8, 10, and 12
`
`Matsunaga and Dickinson
`Matsunaga, Dickinson, and
`Gowda
`
`E. The ’335 Patent
`The ’335 patent describes a complementary metal oxide
`semiconductor (CMOS) image sensor including a unit pixel. Ex. 1001,
`Abstract. A unit pixel is illustrated in Figure 4, reproduced below:
`
`§ 103(a)
`
`§ 103(a)
`
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`
`Figure 4 is a circuit diagram of a unit pixel. Id. at 4:50–51.
`Unit pixel 400 includes two photodiodes 401, 402 connected to
`transfer transistors M43 and M44, respectively. Id. at 4:60–67. The
`photodiodes receive light from an object and generate and integrate
`photoelectric charges. Id. at 5:2–4, 5:9–11. Transfer transistor M43, M44
`
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`transfer the generated charges to single sensing node A in response to
`control signals Tx1 and Tx2, respectively. Id. at 5:4–8, 5:11–15. The
`photodiodes share reset transistor M1, drive transistor M3, and select
`transistor M4. Id. at 4:67–5:2. Reset transistor Ml is coupled between
`power supply Vdd and single sensing node A and outputs the photoelectric
`charges on single sensing node A in response to control signal Rx. Id. at
`5:16–19. Drive transistor M3 is coupled to power supply Vdd and acts as a
`source follower in response to an output of single sensing node A. Id. at
`5:19–22. Select transistor M4 outputs image data in response to a control
`signal Sx, which is produced by address signals. Id. at 5:22–24.
`The operation of unit pixel 400 is shown in Figure 5, reproduced
`below:
`
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`Patent 6,731,335 B1
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`
`Figure 5 is a timing chart illustrating control signals to control transistors in
`unit pixel 400. Id. at 4:52–53, 5:25–26.
`In sections A1 and A2, transfer transistors M43, M44, respectively,
`are turned on and select transistor M4 is turned off, so that photodiodes 401,
`402, respectively, are fully depleted. Id. at 5:29–33, 5:41–46. In sections
`
`
`
`6
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`IPR2018-00687
`Patent 6,731,335 B1
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`B1 and B2, transistors M43, M44, respectively, are turned off and
`photodiodes 401, 402, respectively, generate and integrate photoelectric
`charges. Id. at 5:35–40, 5:47–53. In section C1, reset transistor M1 and
`select transistor M4 are turned on and transfer transistors M43, M44 are
`turned off such that a reset voltage level is outputted through select transistor
`M44 and drive transistor M3 is driven by sensing node A. Id. at 5:54–59. In
`section D1, reset transistor M1 is turned off to settle the voltage and in
`section E1, the reset voltage is sampled. Id. at 5:61–65. In section F1,
`transfer transistor M43 is turned on and integrated photoelectric charges
`from photodiode 401 are transferred to the output terminal through sensing
`node A, drive transistor M3, and select transistor M4. Id.at 5:66–6:6. In
`section G1, transfer transistor M43 is turned off to settle the voltage and in
`section H1, data voltage level is sampled. Id. at 6:7–11. In sections C2–H2,
`sections C1–H1 are repeated for photodiode 402 and transfer transistor M44.
`Id. at 6:12–36.
`The sampled reset and data voltages are output to an analog to digital
`converter (ADC) and the difference between the reset and data digital
`signals becomes an output image value. Id. at 6:52–65.
`Claim 1, reproduced below, is illustrative of the invention:
`1.
`A method for driving a unit pixel which comprises
`a first photodiode for receiving light from an object and for
`generating and integrating photoelectric charges; a first transfer
`transistor coupled between the first photodiode and a single
`sensing node, for transferring the photoelectric charges
`generated in the first photodiode to the single sensing node, in
`response to a first control signal; a second photodiode for
`receiving light from the object and for generating and
`integrating photoelectric charges; a second transfer transistor
`coupled between the second photodiode and the single sensing
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`
`node, for transferring the photoelectric charges generating in
`the second photodiode to the single sensing node, in response to
`a second control signal; a reset transistor coupled between a
`power supply and the single sensing node, for outputting the
`photoelectric charges stored in the single sensing node, in the
`response to a third control signal; a drive transistor coupled to
`the power supply, for acting as a source follower in response to
`an output of the single sensing node; and a select transistor
`coupled to the drive transistor, for outputting an image data
`driven by the drive transistor in response to address signals, the
`method comprising the steps of:
`(a) fully depleting the first and second photodiodes;
`(b) receiving light in the first and second photodiodes and
`generating photoelectric charges;
`(c) turning on the reset transistor, turning off the first and
`second transfer transistors and turning on a
`selector transistor, and outputting a reset voltage
`level through the single sensing node, the drive
`transistor and the select transistor;
`(d) turning off the reset transistor and then turning on the
`first transfer transistor with said reset transistor
`remaining off, and outputting a data voltage level
`of the photoelectric charges generated in the first
`photodiode through the single sensing node, the
`drive transistor and the select transistor;
`(e) turning on the reset transistor, turning off the first
`transfer transistor and outputting the reset voltage
`level through the single sensing node, the drive
`transistor and the select transistor; and
`(f) turning off the reset transistor and then turning on the
`second transfer transistor with said reset transistor
`remaining off, and outputting a data voltage level
`of the photoelectric charges generated in the
`second photodiode through the single sensing
`node, the drive transistor and the select transistor.
`
`8
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`IPR2018-00687
`Patent 6,731,335 B1
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`
`II. ANALYSIS
`Claim Construction
`A.
`We interpret claims of an unexpired patent using the broadest
`reasonable construction in light of the specification of the patent in which
`they appear. See 37 C.F.R. § 42.100(b); Cuozzo Speed Techs., LLC v. Lee,
`136 S. Ct. 2131, 2144–45 (2016). “Under a broadest reasonable
`interpretation, words of the claim must be given their plain meaning, unless
`such meaning is inconsistent with the specification and prosecution history.”
`Trivascular, Inc. v. Samuels, 812 F.3d 1056, 1062 (Fed. Cir. 2016). Neither
`party raises a disputed issue of claim construction that we must address at
`this stage of the proceeding.
`
`B. Asserted Grounds of Unpatentability
`A claim is unpatentable under 35 U.S.C. § 103(a) if the differences
`between the claimed subject matter and the prior art are “such that the
`subject matter as a whole would have been obvious at the time the invention
`was made to a person having ordinary skill in the art to which said subject
`matter pertains.” We resolve the question of obviousness on the basis of
`underlying factual determinations, including: (1) the scope and content of
`the prior art; (2) any differences between the claimed subject matter and the
`prior art; (3) the level of skill in the art; and (4) objective evidence of
`nonobviousness, i.e., secondary considerations.1 See Graham v. John Deere
`Co., 383 U.S. 1, 17–18 (1966).
`
`
`1 The current record does not include allegations or evidence of objective
`indicia of nonobviousness.
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`
`1. Level of Ordinary Skill
`Citing to Dr. Kleinfelder’s testimony, Petitioner contends that a
`skilled artisan would have had a Bachelor’s degree in electrical engineering
`and approximately four years of relevant experience with image sensors, or,
`alternatively, a Master’s degree in electrical engineering or related field with
`at least two years of relevant experience with image sensors. Pet. 14–15
`(citing Ex. 1002 ¶ 10). Patent Owner does not contest Petitioner’s proposal
`or provide a proposal of its own. We credit Dr. Kleinfelder’s testimony and,
`on the current record, adopt Petitioner’s proposed level of ordinary skill.
`
`
`2. Alleged Obviousness of Claims 1–5, 7, 9, and 11 over
`Takahashi
`Petitioner contends that claims 1–5, 7, 9, and 11 would have been
`obvious over Takahashi. Pet. 23–39. For the reasons given below,
`Petitioner has demonstrated a reasonable likelihood that it would prevail on
`this ground.
`
`
`a. Scope and Content of the Prior Art—Overview of
`Takahashi
`Takahashi describes a CMOS solid-state image pickup apparatus.
`Ex. 1006, 1:7–10. Figures 1 and 8 depict example circuit diagrams of
`similar embodiments. We focus primarily on the embodiment of Figure 8,
`reproduced below, although we discuss Figure 1 for components that overlap
`the two embodiments.
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`
`Figure 8 is a schematic circuit constructional diagram of a photoelectric
`converting device. Id. at 3:55–57. We note that most of the features of
`Figure 8 are described with respect to Figure 1. Figure 1 shows a similar
`
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`circuit that uses photo gate 2 to convert light to photoelectric charge. Id. at
`4:21–24, 5:17–20. “The embodiment [of Figure 8] is characterized in that
`no photo gate is used in the photoelectric converting unit but a pn
`photodiode 24 is used.” Id. at 9:31–34. Petitioner contends that Figures 1
`and 8 are otherwise identical, Pet. 22, a point that Patent Owner does not
`dispute. We agree that this is the most logical reading of Takahashi, as both
`figures share most of their numerical designations. Because claim 1 refers to
`a photodiode, rather than a photo gate, Figure 8 is the most relevant to this
`proceeding and we focus our discussion there, with reference to Takahashi’s
`discussion of Figure 1 where appropriate.
`In Figure 8, two instances of photodiode 24 are coupled to two
`instances of transfer switch MOS transistor 3, respectively. Ex. 1006, 4:24–
`25. MOS transistor for resetting 4 and source-follower amplifier MOS
`transistor 5 are coupled to power supply VDD and transfer switches 3. Id. at
`25–26. Horizontal selection switch MOS transistor 6 is coupled to amplifier
`5. Id. at 4:26–27.
`Takahashi’s circuit operation is shown in Figure 3, reproduced below:
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`
`Figure 3 is a timing chart for the embodiment of Figure 1. Id. at 3:44–45.
`Petitioner acknowledges that “Takahashi does not explicitly state that the
`timing of FIG. 3 is employed for FIG. 8,” but argues that “one of ordinary
`
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`skill in the art would immediately recognize that the timing chart of FIG. 3 is
`equally applicable to the pixel of FIG. 8 because the charge transfer and
`CDS [correlated double sampling] operations shown in FIG. 3 are applied
`equally to the pixel of photodiodes as well as the pixel of photo gates.”
`Pet. 37. As Petitioner notes, Takahashi describes no other timing for the unit
`pixel of Figure 8. Id. Thus, Petitioner argues, Figure 3 would be equally
`applicable to Figure 8 or, at least, would have been obvious to use with
`Figure 8. Id. at 38. Patent Owner does not advance any other reading of
`Takahashi. We agree with Petitioner that the most logical reading of
`Takahashi is that the timing diagram of Figure 3 applies equally to the
`circuit of Figure 8, at least as to the components that share the same
`numerical designations.
`With reference to Figure 3, during time T0, selection switch transistor
`6 is turned on via control pulse ɸS0 and reset transistor 4 is turned off via
`control pulse ɸR0. Ex. 1006, 4:58–5:7. During time T1, the reset voltage
`(referred to by Takahashi as “dark voltage”) is output and, subsequently, the
`top transfer switch transistor 3 is turned on via control pulse ɸTXo0. Id. at
`5:7–15. During time T2, photoelectric charge is transferred from the top
`photodiode 24 and, at time T3, the charge is output. Id. at 5:24–31. Figure 3
`shows that this process is repeated for the bottom transfer switch transistor 3
`(controlled by pulse ɸTXe0) and bottom photodiode 24. Id. at 6:6–13.
`
`
`b. Claim 1
`The preamble of method claim 1 recites a specific structure of a unit
`pixel, including “a first photodiode,” “a first transfer transistor . . . for
`transferring the photoelectric charges . . . in response to a first control
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`signal,” “a second photodiode,” “a second transfer transistor . . . for
`transferring the photoelectric charges . . . in response to a second control
`signal,” “a reset transistor,” “a drive transistor coupled to the power supply,”
`and “a select transistor.” These components are arranged in claim 1’s
`preamble in substantially the same manner as shown in the ’335 patent’s
`Figure 4, reproduced above.
`Petitioner maps the components shown in Takahashi’s Figures 1 and 8
`to these components as follows:
`top photo gate 1 (Figure 1) or top photodiode 24 (Figure 8) to
`“first photodiode” of claim 1;
`top transfer switch transistor 3 and control signal ɸTXo0 to
`“first transfer transistor” and “first control signal” of
`claim 1;
`bottom photo gate 1 (Figure 1) or bottom photodiode 24
`(Figure 8) to “second photodiode” of claim 1;
`bottom transfer switch transistor 3 and control signal ɸTXe0 to
`“second transfer transistor” and “second control signal”
`of claim 1;
`reset transistor 4 to “reset transistor” of claim 1;
`source-follower amplifier transistor 5 to “drive transistor” of
`claim 1;
`selection switch transistor 6 to “select transistor of claim 1; and
`the junction of transistors 3, 4, and 5 to the “single sensing
`node” of claim 1.
`Pet. 24–26, 36. A comparison of the ’335 patent’s Figure 4 with
`Takahashi’s Figure 8 shows that the components identified by Petitioner are
`arranged in the same manner as in the preamble of claim 1. Patent Owner
`does not contest this.
`
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`
`Petitioner contends that Takahashi teaches (e.g., through Figure 3 and
`its corresponding description) each step of claim 1 except for claim 1(a)
`(“fully depleting the first and second photodiodes”). Pet. 26–31, 36–38. We
`agree that Petitioner’s evidence supports a finding that Takahashi teaches
`each of steps 1(b)–1(f). Patent Owner does not contest these allegations.
`We briefly review Petitioner’s evidence as to steps 1(b)–1(f) and then
`discuss in detail Petitioner’s obviousness arguments as to step 1(a), which
`Patent Owner does contest.
`As to step 1(b), Petitioner contends that, inter alia, Figure 9 of
`Takahashi shows photodiodes 24 receiving light (hν) and generating
`photoelectric charges. Pet. 26; see also Ex. 1006, 9:37 (stating that charges
`are generated in photodiodes 24). As to step 1(c), as Petitioner notes
`(Pet. 27–28), during time T0, reset transistor 4 and selection switch
`transistor 6 are on, transfer switch transistors 3 are off, and a reset (“dark”)
`voltage is output through the junction of transistors 3, 4, and 5. Ex. 1006,
`4:58–5:11, Fig. 3. As to step 1(d), as Petitioner explains, at the end of time
`T0, reset transistor 4 is turned off; and during time T1, top transfer switch
`transistor 3 is turned on (with signal ɸTXo0) while reset transistor 4 is off,
`and charge from the top photodiode 24 is output through the junction of
`transistors 3, 4, and 5, source-follower amplifier transistor 5, and selection
`switch transistor 6. Id. at 5:7–23, Fig. 3. As to steps 1(e) and 1(f), Petitioner
`argues that Figure 3 shows that steps 1(c) and 1(d) are repeated for the
`bottom photodiode 24 and transfer switch transistor 3. Pet. 29–31, 36–37.
`We agree with Petitioner. See Ex. 1006, 6:6–13, Fig. 3.
`Petitioner concedes that Takahashi does not disclose step 1(a).
`Pet. 23. Nevertheless, Petitioner argues that it would have been obvious to
`
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`fully deplete Takahashi’s photodiodes “in order to eliminate any residual
`charges on the photodiode prior to capturing an image.” Id. Petitioner cites
`to Dr. Kleinfelder, who testifies:
`There are important reasons to deplete a photodiode prior to
`integration. One such reason is a phenomenon known as “dark
`current,”[2] which can cause charge to accumulate in a
`photodiode even without any light exposure. The gradual
`accumulation of this unwanted charge degrades the quality of
`an image in the form of noise. Another reason photodiodes are
`depleted before integration is that photodiodes may retain
`accumulated electric charges from a previous image if those
`electric charges were not fully transferred to the floating
`diffusion from the prior readout.
`Ex. 1002 ¶ 73.
`Dr. Kleinfelder also notes that the ’335 patent describes a step of fully
`depleting a photodiode as part of the prior art. Id. In particular, in
`describing Figures 2 and 3, which the figures themselves identify as “prior
`art,” the ’335 patent describes, as the first step of a process for a
`“conventional unit pixel”: “1) In section ‘A’ of FIG. 3, the transfer
`transistor M21 and the reset transistor M11 are turned on and the select
`transistor M41 is turned off, so that the photodiode 101 is fully depleted.”
`Ex. 1001, 2:17–20 (emphasis added), 2:59.
`Patent Owner contends that Takahashi does not teach step 1(a) of
`claim 1. Patent Owner acknowledges that the considerations identified by
`
`
`2 “Dark current” is “(3) (photoelectric device) The current flowing in the
`absence of irradiation.” IEEE 100, THE AUTHORITATIVE DICTIONARY OF
`IEEE STANDARDS TERMS 267 (7th ed. 2000). On the current record, this
`appears to be different from the “dark voltage” described in Takahashi (e.g.,
`Ex. 1006, 5:7–11) as the voltage output when a pixel is reset.
`
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`Dr. Kleinfelder “generally need to be taken into account in image sensor
`design.” Prelim. Resp. 17. Nevertheless, Patent Owner argues, Takahashi
`already describes mechanisms for addressing dark current and residual
`charges and, therefore, a skilled artisan would not have had a reason to
`perform step 1(a) in Takahashi’s procedure. Id. at 17–18.
`With respect to Takahashi’s Figure 8, Takahashi states that “[c]harges
`generated by the control pulse ɸTX are completely transferred to the FD
`portion.” Ex. 1006, 9:37–39. Takahashi has similar description for the
`embodiment of Figure 1. Id. at 5:17–23 (“In this instance, it is preferable to
`set to a voltage relation such as to raise a potential well extending under the
`photo gate 2 and to allow the light generation carriers to be perfectly
`transferred to the FD portion 21. Therefore, so long as the complete transfer
`can be performed, the control pulse ɸTX is not limited to a pulse but can be
`also set to a fixed electric potential.”). Takahashi also describes another
`embodiment in which
`the surface p+-type layer 26 constructs the photoelectric
`converting unit together with the n-type layer 25 and a pixel is
`formed by a buried type photodiode. With such a structure, a
`dark current which is generated in the surface can be
`suppressed. As compared with Fig. 9, since high photo charges
`of a good efficiency can be obtained, an image signal of a high
`S/N ratio and a high quality can be obtained.
`Id. at 10:6–14.
`Patent Owner argues that Petitioner “ignores these teachings when it
`assumes that it would have been obvious for a [person of ordinary skill in
`the art] to add the step of ‘fully depleting the first and second photodiodes’
`to the Takahashi system” and “does not acknowledge this structural element
`and does not explain why it would have been obvious for a [person of
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`ordinary skill in the art] to implement the step of fully depleting the
`photodiodes when a structural element is already in place for accomplishing
`this result.” Prelim. Resp. 19–20. Referring to these aspects of Takahashi,
`Patent Owner argues that
`structural elements exist in Takahashi to ensure that the electric
`charges are fully transferred to the floating diffusion during
`readout. Thus, using Dr. Kleinfelder’s own logic, it is
`unnecessary in Takahashi to fully deplete the photodiodes
`before readout as an initial step in driving a unit pixel for
`capturing the next image.
`Id. at 20. Patent Owner argues that the precondition Dr. Kleinfelder sets for
`needing step 1(a) is not met in Takahashi. Id. at 21. According to Patent
`Owner, “[s]ince the charges in the photodiode are completely transferred to
`the floating diffusion during image readout, a [person of ordinary skill in the
`art] would have recognized no need to implement a step of fully depleting
`the photodiodes before integrating a new image.” Prelim. Resp. 22. Patent
`Owner characterizes this as “a strong teaching away that militates in favor of
`non-obviousness.” Id. at 2, 29.
`At this stage of the proceeding, we credit Dr. Kleinfelder’s testimony
`that a skilled artisan would have had reasons to implement step 1(a) in
`Takahashi’s system to avoid noise and degradation of image quality due to
`dark current or retained accumulated charge in the photodiodes. Ex. 1002
`¶ 73. The ’335 patent clearly identifies this step as conventional in the art of
`CMOS image sensors. Ex. 1001, 2:17–20. Patent Owner points us to
`statements in Takahashi that it contends also solve the problems identified
`by Dr. Kleinfelder. Nevertheless, even if we fully credit these arguments,
`they do not persuade us that a skilled artisan would have been dissuaded or
`discouraged from implementing step 1(a) in Takahashi’s system. See In re
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`Mouttet, 686 F.3d 1322, 1334 (“[T]he mere disclosure of alternative designs
`does not teach away. This court has further explained that just because
`better alternatives exist in the prior art does not mean that an inferior
`combination is inapt for obviousness purposes.”) (internal citations and
`quotation marks omitted). Petitioner’s evidence supports a finding that a
`skilled artisan would have had reasons to implement step 1(a) of claim 1 in
`Takahshi’s system.
`In sum, on the current record, Petitioner has established a reasonable
`likelihood that it would prevail with respect to claim 1 as obvious over
`Takahashi.
`
`
`c. Claim 2–5, 7, 9, and 11
`Claim 2 depends from claim 1 and recites that step 1(b) includes
`“generating and integrating the photoelectric charges of the first photodiode,
`regardless of the states of the reset transistor, the second transfer transistor
`and the select transistor, while the first transfer transistor is turned off.”
`Claim 4 depends from claim 1 and adds a similar limitation as to the second
`photodiode. Petitioner argues that Figure 3 of Takahashi shows the reset
`transistor, select transistor, and other transfer transistor changing states while
`the transfer transistor for a photodiode is off (and the photodiode is
`generating and integrating charge). Pet. 31–32, 38–39. Dr. Kleinfelder
`testifies that generation and integration of photoelectric charges on a
`photodiode occur whenever the corresponding transfer transistor is turned
`off. Ex. 1002 ¶ 74. This evidence supports findings that Takahashi teaches
`the additional limitations of claims 2 and 4.
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`
`Claim 3 depends from claim 2 and recites “wherein the method
`controls a depletion time and a photo charge generating and integrating time
`by adjusting a turn-on time and a turn-off time for the first and second
`transfer transistors.” Dr. Kleinfelder testifies that “a depletion time and a
`photo charge generating and integrating time are controlled by the timing
`operations of the corresponding transfer transistor, with depletion capable of
`occurring when the transfer transistor is turned on and generation and
`integration of photoelectric charges capable of occurring when the transfer
`transistor is turned off.” Ex. 1002 ¶ 75; Pet. 39. This evidence supports
`findings that Takahashi teaches the additional limitations of claim 3.
`Claims 5, 7, 9, and 11 depend from claim 1 and account for a settling
`time between when the reset or transfer transistors are turned off and the
`respective reset or data values are sampled. For each of these claims,
`Petitioner points to evidence, shown in particular in Figure 3, that Takahashi
`incorporates “a brief pause” between when the respective transistor is turned
`off and when the reset or data value is sampled. Pet. 32–36. This evidence
`supports findings that Takahashi teaches the additional limitations of claims
`5, 7, 9, and 11.
`In sum, on the current record, Petitioner has established a reasonable
`likelihood that it would prevail with respect to claims 2–5, 7, 9, and 11 as
`obvious over Takahashi. Patent Owner does not present separate argument
`for these dependent claims.
`
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`
`3. Alleged Obviousness of Claims 6, 8, 10, and 12 over
`Takahashi and Gowda
`Petitioner contends that claims 6, 8, 10, and 12 would have been
`obvious over Takahashi and Gowda. Pet. 41–44. For the reasons given
`below, Petitioner has demonstrated a reasonable likelihood that it would
`prevail on this ground.
`
`
`a. Scope and Content of the Prior Art—Overview of
`Gowda
`Gowda describes a CMOS image sensor in which correlated double
`sampling is performed entirely in the digital domain. Ex. 1007, Abstract.
`Figure 3, reproduced below, illustrates an example:
`
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`
`
`Figure 3 is a schematic block diagram of an image sensor. Id. at 3:44–45.
`In Gowda’s device 20, analog to digital converters (ADC) 401 to 40N
`replace analog readout circuits to read the outputs of a plurality of pixels 30.
`Id. at 3:55–61. According to Gowda, “A/D converters 401–40N directly
`convert the reset level and signal level on the respective column busses 151–
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`IPR2018-00687
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`15N to digital values, which are then stored in registers 421–42N.” Id. at
`3:61–64. Gowda states that
`The data stored in the registers are transferred to logic block 44
`which includes processing/subtraction circuitry to subtract the
`reset levels from the corresponding signal levels to complete a
`correlated double sampling operation. As a result, since noisy
`analog capacitors to store the reset and signal levels are
`obviated, the accuracy of the correlated double sampling is
`improved.
`Id. at 3:64–4:4.
`
`
`b. Claim 6, 8, 10, and 12
`Claim 6 depends from claim 5 and recites “wherein the sampled reset
`voltage level is outputted to an analogue-to-digital converter so that the
`sampled reset voltage level is converted into a digital signal.” Claims 8, 10,
`and 12 depend from claims 7, 9, and 11, respectively, and add substantially
`the same limitation for the sampled data voltage levels (claims 7, 11) and
`reset voltage level (claim 9).
`Petitioner argues that Gowda provides an express example of the use
`of an ADC to sample reset and data voltage levels and convert them to
`digital signals. Pet. 41–43. As explained above, Gowda describes a CMOS
`imaging device in which “A/D converters . . . directly convert the reset level
`and signal level on the respective column buses . . . to digital values, which
`are then stored in registers . . . .” Ex. 1007, 3:61–64. Petitioner argues and
`Dr. Kleinfelder testifies that Gowda includes an explicit motivation to
`combine its ADCs with the pixels disclosed in Takahashi, namely, noise
`reduction and increased accuracy. Pet. 43–44 (citing Ex. 1007, 3:64–4:4);
`Ex. 1002 ¶ 76.
`
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`
`Petitioner’s evidence supports findings that Gowda teaches the
`additional limitations of claims 6, 8, 10, and 12, and that a skilled artisan
`would have had reasons to combine the teachings of Takahashi and Gowda.
`In sum, on the current record, Petitioner has established a reasonable
`likelihood that it would prevail with respect to claims 6, 8, 10, and 12 as
`obvious over Takahashi and Gowda. Patent Owner does not raise separate
`arguments for this ground. Prelim. Resp. 34.
`
`
`4. Alleged Obviousness of Claims 1–5, 7, 9, and 11 over
`Takahashi and Dickinson
`Petitioner contends that claims 1–5, 7, 9, and 11 would have been
`obvious over Takahashi and Dickinson. Pet. 47–49. For the reasons given
`below, Petitioner has demonstrated a reasonable likelihood that it would
`prevail on this ground.
`
`
`a. Scope and Content of the Prior Art—Overview of
`Dickinson
`Dickinson describes an active pixel image sensor with active pixel
`circuitry shared by multiple sensing elements. Ex. 1008, Abstract. Figure 4,
`reproduced below, illustrates an example:
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`
`Figure 4 is a circuit diagram of an active pixel image sensor. Id. at 3:9–10
`Photodiodes RD, GRN, and BL capture red, green, and blue light,
`respectively, and are connected through gating elements Q4, Q5, and Q6,
`respectively. Id. at 4:5–11. Each photodiode/gating element pair is
`connected in parallel to the gate of a source follower, formed by transistors
`Q2 and Q3, and also are connected to power source Vdd through reset
`transistor Q1. Id. at 4:11–15. In operation, inter alia, “[e]ach RD, GRN and
`BL photodiode is first pre-charged by connecting each photodiode to Vdd,
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`IPR2018-00687
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`by holding the reset signal high while pulsing each of the gate transistors
`TX1 to TX3 as shown with timing ‘A’ [of Figure 5].” Id. at 4:20–25, Fig. 5.
`
`
`b. Claim 1–5, 7, 9, and 11
`Petitioner contends that Dickinson includes an express disclosure of
`claim element 1(a), “fully depleting the first and second photodiodes.”
`Pet. 47. In particular, Petitioner contends that Dickinson’s disclosure
`relative to time period “A” of its Figure 5 (Ex. 1008, 4:

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