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`18% efficient silicon photovoltaic devices by rapid thermal diffusion and oxidation | IEEE Journals & Magazine | IEEE Xplore
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`Journals & Magazines > IEEE Transactions on Electron... > Volume: 45 Issue: 8 
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`18% efficient silicon photovoltaic devices by rapid thermal diffusion and oxidation
`Publisher: IEEE
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`Abstract:
`For the first time, cells formed by rapid thermal processing (RTP) have resulted in 18%-efficient 1 and 4 cm/sup 2/
`single-crystal silicon solar cells. Front surface pass... View more
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`Abstract:
`For the first time, cells formed by rapid thermal processing (RTP) have resulted in 18%-efficient 1 and 4 cm/sup 2/
`single-crystal silicon solar cells. Front surface passivation by rapid thermal oxidation (RTO) significantly enhanced the
`short wavelength response and decreased the effective front surface recombination velocity (including contact effects)
`from 7.5/spl times/10/sup 5/ to about 2/spl times/10/sup 4//spl times/10/sup 4/ cm/s. This improvement resulted in an
`increase of about 1% (absolute) in energy conversion efficiency, up to 20 mV in V/sub ot/, and about 1 mA/cm/sup 2/ in
`J/sub sc/. These RTO-induced enhancements are shown to be consistent with model calculations. Since only 3 to 4
`min are required to simultaneously form the phosphorus emitter and aluminum back-surface-field (BSF) and 5 to 6 min
`are required for growing the RTO, this RTP/RTO process represents the fastest technology for diffusing and oxidizing
`/spl ges/18%-efficient solar cells. Both cycles incorporate an in situ anneal lasting about 1.5 min to preserve the
`minority carrier lifetime of lower quality materials such as dendritic-web and multicrystalline silicon. These high-
`efficiency cells confirmed that RTP results in equivalent performance to cells fabricated by conventional furnace
`processing (CFP). Detailed characterization and modeling reveals that because of RTO passivation of the front surface
`(which reduced J/sub 0c/ by nearly a factor of ten), these RTP/RTO cells have become base dominated (J/sub 0b//spl
`Gt/J/sub 0c/), and further improvement in cell efficiency is possible by a reduction in back surface recombination
`velocity (BSRV). Based upon model calculations, decreasing the BSRV to 200 cm/s is expected to give 20%-efficient
`RTP/RTO cells.
`
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`6/22/24, 3:37 PM
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`18% efficient silicon photovoltaic devices by rapid thermal diffusion and oxidation | IEEE Journals & Magazine | IEEE Xplore
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`Published in: IEEE Transactions on Electron Devices ( Volume: 45 , Issue: 8, August 1998)
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`Page(s): 1710 - 1716
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`Date of Publication: August 1998 
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` ISSN Information:
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`References is not available for this document.
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`DOI: 10.1109/16.704369
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`Publisher: IEEE
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`2/6
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`Petitioner Canadian Solar Inc. - Ex. 1057, p. 2
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`

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`6/22/24, 3:37 PM
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`18% efficient silicon photovoltaic devices by rapid thermal diffusion and oxidation | IEEE Journals & Magazine | IEEE Xplore
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`3/6
`
`Petitioner Canadian Solar Inc. - Ex. 1057, p. 3
`
`

`

`6/22/24, 3:37 PM
`
`18% efficient silicon photovoltaic devices by rapid thermal diffusion and oxidation | IEEE Journals & Magazine | IEEE Xplore
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`Rapid thermal processing of conventionally and electromagnetically cast 100 cm/sup 2/ multicrystalline silicon
`Conference Record of the Twenty Fifth IEEE Photovoltaic Specialists Conference - 1996
`Published: 1996
`
`Rapid thermal processing of thin gate dielectrics. Oxidation of silicon
`
`https://ieeexplore.ieee.org/document/704369/references#references
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`4/6
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`Petitioner Canadian Solar Inc. - Ex. 1057, p. 4
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`

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`6/22/24, 3:37 PM
`18% efficient silicon photovoltaic devices by rapid thermal diffusion and oxidation | IEEE Journals & Magazine | IEEE Xplore
`IEEE Electron Device Letters
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