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APERIO

50168562 | Trademark citeCite Docket

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Filed Oct. 19, 2026
Serial No. 50168562
Class Semiconductor metrology, inspection, review, and testing apparatus and instruments, namely, electron-beam and optical inspection systems, electron and scanning electron microscopes, critical dimension measurement systems, x-ray imaging systems, and defect review and defect analysis apparatus; Downloadable computer software for operating and controlling semiconductor metrology, inspection, review, and testing apparatus and instruments, and for image acquisition, defect detection, defect classification, defect review, critical dimension measurement, metrology data analysis, and yield analysis in semiconductor manufacturing.; 021; 023; 026; 036; 038
APERIO
Case Type Trademark
Status New application awaiting assignment to an examining attorney. <a href="https://www.uspto.gov/dashboard/trademarks/application-timeline.html">See current trademark processing wait times </a> for more information.
Last Updated: 6 days, 18 hours ago
Filing Date # Docket Text
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