Filed Sept. 21, 2016

Serial No. 79199909

Registered May 29, 2018

Registration No. 5,477,581

Class computer software for diffractometric analysis of materials; computer software for spectrometric analysis of materials; computer software for x-ray fluorescence analysis of materials; computer software for determining X-ray intensities; computer software for determining the thickness of layer samples; computer software for determining chemical composition of materials; computer software for standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing * or for use in the medical sector * ; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analyzers; X-ray tubes; X-ray apparatus; computer software and hardware for X-ray diffraction and operating X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid; all of the aforesaid goods being for use in the fields of cement production, mining, mineral beneficiation, iron, steel and non-ferrous metals, petroleum and petrochemicals, polymers, glass production, forensics, environmental protection, Restriction of Hazardous Substances compliance, food and cosmetics, and pharmaceutical compounds; none of the aforesaid goods being for medical purposes or for use with silicon wafers in the semi-conductor industry; 021; 023; 026; 036; 038

Case Type Trademark