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NMF

79413337 | Trademark

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Filed Nov. 6, 2024
Serial No. 79413337
Registered Dec. 23, 2025
Registration No. 8,072,772
Class Measuring apparatus, namely non-contact 3D form metrology tools, optical interferometers, white-light confocal microscopes, confocal sensors, 3D laser scanners, structured light scanners, profilometers, all for use in high-precision measurement and analysis of surfaces, surface forms and the optical and technical components; calibration apparatus for 3D surface metrology; metrology tools and instruments, namely surface metrology tools, 3D form metrology tools, custom metrology instruments for 3D surface metrology, ultra-precision aspherical and freeform optics metrology instruments for measuring and analysis of surfaces and surface forms, and the optical and technical components; optical measurement devices, namely non-contact optical measurement instruments for high-precision measurement and analysis of surface form, roughness, micro- and nano-structures, meta optics, and the topography of optical and technical components; downloadable software for operating the aforementioned tools, devices, apparatus and instruments, and controlling and analysing their generated data and information; 021; 023; 026; 036; 038
NMF
Case Type Trademark
Status Registered. The registration date is used to determine when post-registration maintenance documents are due.
Last Updated: 14 hours ago
Filing Date # Docket Text