Filed Aug. 27, 2024

Serial No. 79418464

Registered Aug. 11, 2026

Registration No. 8,386,912

Class Scientific apparatus and instruments, namely, X-ray fluorescence spectrometers for measuring the elemental composition of materials, other than for medical purposes; scientific instruments, namely, X-ray fluorescence spectrometers for detecting the elemental composition of materials, other than for medical purposes; scientific apparatus and instruments, namely, spectrometers for laboratory use; X-ray fluorescence analyzers; x-ray spectrometers for laboratory use; Scientific apparatus and instruments, namely, diffractometers for measuring and detecting the diffraction of waves including X-rays; Scientific apparatus and instruments, namely. X-ray diffractometers for measuring and detecting crystal structure, crystallinity, microstructural properties and crystalline phase identification; Scientific apparatus and instruments, namely, neutron activation analysers for analysing the elemental composition of a material including trace elements; Scientific apparatus and instruments, namely, pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; X-ray detecting apparatus and instruments, namely, X-ray fluorescence analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray fluorescence analyzers not for medical purposes; spectrometers for laboratory use; Electronic spectrophotometers for use in identifying and measuring colours; apparatus for mass spectrometry; X-ray photo electron spectroscopy analysers, not for medical use; apparatus for analyzing gaseous, liquid, and solid elements, namely, neutron activation analysers, pulsed fast and thermal neutron activation analysers, and X-ray diffractometers; X-ray neutron activation analysers for analysing the elemental composition of a material including trace elements; X-ray pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; X-ray analytical apparatus, namely, X-ray fluorescence analyzers; industrial X-ray apparatus not for medical use; Spectrometers, other than for medical purposes, namely, X-ray micro-diffractometers; Spectrometers, other than for medical purposes, namely, X-ray diffractometers; Spectrometers for laboratory use, namely, diffractometers; X-ray spectrometers for laboratory use, namely, x-ray diffractometers; X-ray fluorescence spectrometers, namely, x-ray fluorescence diffractometers for laboratory use; Semiconductor wafer analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects of semiconductor wafers; X-ray diffraction instruments, namely X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects of semi-conductor wafers and discs; automated spectroscopes, namely, ellipsometers; X-ray fluorescence wafer and disc analysers for analysing film thickness, composition and density of semi-conductor wafers and discs for the silicon semiconductor industry; Automated spectroscopes, namely, ellipsometers for the silicon semiconductor industry; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray Fluorescence Spectrometers, and X-ray Spectrometers for laboratory use; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray fluorescence spectrometers, x-ray tubes, other than for medical purposes; X-ray tubes, not for medical purposes; analytical, process control and measuring apparatus, namely, spectrometers for laboratory use, X-ray fluorescence analyzers; analytical, process control and measuring apparatus, including spectrometers for laboratory use, X-ray fluorescence analysers for cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industries; analytical, process control and measuring apparatus, including spectrometers for laboratory use, x-ray fluorescence analysers for research and development institutions; metrology tools, namely, spectrometers for laboratory use, X-ray fluorescence analyzers; Downloadable computer software for controlling and operating measuring instruments and for processing and analyzing data in the field of materials characterization; Downloadable computer software for analysing the elemental composition of a material including trace elements, crystal structure, crystallinity, microstructural properties and crystalline phase identification; Downloadable computer software for determining chemical composition of materials in the field of spectrometry; downloadable computer software for operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry; Recorded computer software for operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry; Downloadable computer software for operating x-ray diffractometers and reviewing and analyzing data in the field of x-ray diffraction; Computer hardware relating to X-ray diffraction and X-ray diffraction apparatus; Downloadable computer software for operating x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Recorded computer software for operating x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Downloadable computer software for determining X-ray intensities; Recorded computer software for determining X-ray intensities; Downloadable computer software for operating and controlling x-ray apparatuses in the field of X-ray apparatuses; Downloadable computer software for performing X-ray diffraction analysis; Recorded computer software for performing x-ray diffraction analysis; Downloadable computer software for determining the thickness of semiconductor wafer layer samples; Recorded computer software for determining the thickness of semiconductor wafer layer samples; Downloadable computer software for determining chemical compositions; Recorded computer software for determining chemical compositions; Downloadable computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Recorded computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; 021; 023; 026; 036; 038; 100; 103; 106; 100; 101

Case Type Trademark Service mark