Filed Feb. 11, 2025

Serial No. 79420468

Registered May 5, 2026

Registration No. 8,237,543

Class Downloadable computer software for use in processing semiconductor wafers; Recorded computer software for use in processing semiconductor wafers, namely software for controlling semiconductor inspection and metrology systems; semi-conductor memories; detectors, namely electron-beam detectors, particle detectors, and contamination detectors for use in semiconductor wafer inspection; precision measuring apparatus; electronic measuring apparatus, namely, surface patterning, dimensional measuring apparatus, and structural measuring apparatus for semiconductor wafer inspection; tool measuring instruments; semiconductor testing apparatus; probes for testing semiconductors; semiconductor testing machines; Electric measuring devices, namely surface patterning, dimensional measuring devices and structural measuring devices for semiconductor wafer inspection; vacuum tube characteristic testers; circuit testers; lasers for measuring purposes; electron capture detectors; semiconductors; electronic semi-conductors; semiconductor wafers; semiconductor chips; photo-semiconductors; optical sensors; optical fibres being light conducting filaments; semi-conductor devices; electron-beam tube; waveguides for high-energy electron beam delivery; waveguides for high power beam delivery; measuring sensors for measuring electrical, physical, and structural properties of semiconductor wafers and devices, not for medical use; 021; 023; 026; 036; 038

Case Type Trademark