Filed April 14, 2016

Serial No. 87001092

Registered Nov. 28, 2017

Registration No. 5,347,111

Class Optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for measuring 2D and 3D dimensions, surface roughness, texture, and spectral color; Sensors, detectors, computer hardware, and software for measuring or detecting environmental parameters in the nature of humidity, gas, airborne particles, vibration and temperature; Optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for solder paste inspection, and automated optical inspection of circuit board assemblies; Optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for dimensional metrology measurement and detection of objects, including contour, shape, thickness, waviness, warpage, angle, radius, diameter and height of such objects; Optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for control of electronic assembly manufacturing processes; Optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for detection and classification of object features; Optical, laser and machine vision sensors, cameras, computer hardware, and software for inspection of back-end semiconductor packaging; Optical, laser and machine vision sensors, cameras, computer hardware, and software for robotic guidance for the pick and placement of components on circuit board assemblies, ranging, collision avoidance, environment mapping and surgical assistance; Optical, laser and machine vision sensors, cameras, detectors, computer hardware, and software for reverse engineering, scanning and digitizing of objects; Sensors, detectors, computer hardware, and software that enables semiconductor tool setup and maintenance of the tool resulting in improved semiconductor manufacturing efficiencies, yields and quality; Sensors, cameras, detectors, computer hardware, and software for detecting and mapping the location of semiconductor wafers; and machine vision systems comprising sensors, computer hardware and software; 021; 023; 026; 036; 038

Case Type Trademark