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EXSOLVE

88222866 | Trademark citeCite Docket

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Filed Dec. 10, 2018
Serial No. 88222866
Registered Oct. 22, 2019
Registration No. 5,888,865
Class high brightness, submicron ion and electron beam columns using field emission technology, namely, focused ion beam columns for ion lithography, ion beam milling, secondary ion mass spectroscopy and mask repair; focused electron beam columns for electron beam lithography, electron beam microscopy, and liquid metal ion sources; 021; 023; 026; 036; 038
EXSOLVE
Case Type Trademark
Status A Sections 8 and 15 combined declaration has been accepted and acknowledged.
Last Updated: 2 weeks, 4 days ago
Filing Date # Docket Text
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