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PASCALO

99672276 | Trademark citeCite Docket

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Filed Feb. 26, 2026
Serial No. 99672276
Examining Attorney null
Class Metrology apparatus for semiconductor manufacturing, namely, in-situ units for measuring thin film stress on semiconductor wafers during transport into and out of process chambers of physical vapor deposition and chemical vapor deposition tools; downloadable and recorded computer software for controlling, operating, and analyzing measurements from in-situ units for measuring thin film stress on semiconductor wafers during transport into and out of process chambers of physical vapor deposition and chemical vapor deposition tools; 021; 023; 026; 036; 038
PASCALO
Case Type Trademark
Status Notice of Allowance (NOA) sent (issued) to the applicant. Applicant must file a Statement of Use or Extension Request within six months of the NOA issuance date.
Last Updated: 2 days, 23 hours ago
Filing Date # Docket Text
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