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Click below for detailed party information:

Inventors

Wookjin LEE Ghilgeun Oh

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SAMSUNG ELECTRONICS CO., LTD.

Assignee

SAMSUNG ELECTRONICS CO., LTD.

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LEE, WOOKJIN, Assignor OH, GHILGEUN, Assignor

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INSPECTION SYSTEM AND INSPECTION METHOD FOR SEMICONDUCTOR DEVICE

18/118,350 | U.S. Patent Application

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Filed March 7, 2023

Examiner Hung Nguyen

Class 356

Art Group 2882

Patent No. 12,379,328

Case Type Utility

Status Patented Case

Last Updated: 5 days, 12 hours ago

Date	#	Transaction
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INSPECTION SYSTEM AND INSPECTION METHOD FOR SEMICONDUCTOR DEVICE

18/118,350 | U.S. Patent Application

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