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TEST CONFIGURATION FOR THE FUNCTIONAL TESTING OF A SEMICONDUCTOR CHIP

09/826,594 | U.S. Patent Application

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Location ELECTRONIC
Filed April 5, 2001
Examiner ERNEST F KARLSEN
Class 324
Art Group 2829
Patent No. 6,825,682
Case Type Utility - 324/763000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child 100 16 996.1
Last Updated: 5 years, 6 months ago
Date # Transaction