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Click below for detailed party information:

Inventors

Arndt Gruber Ralf Schneider Bernhard Ruf Norbert Wirth

Assignee

INFINEON TECHNOLOGIES AG

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INFINEON TECHNOLOGIES AG, Assignor POLARIS INNOVATIONS LIMITED, Assignor QIMONDA AG, Assignor

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INTEGRATED CIRCUIT, TEST STRUCTURE AND METHOD FOR TESTING INTEGRATED CIRCUITS

09/929,303 | U.S. Patent Application

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Location FILE REPOSITORY (FRANCONIA)

Filed Aug. 13, 2001

Examiner SON T DINH

Class 365

Art Group 2824

Patent No. 6,618,303

Case Type Utility - 365/201000

Status Patented Case

Child 100 39 350.0

Last Updated: 5 years, 9 months ago

Date	#	Transaction
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INTEGRATED CIRCUIT, TEST STRUCTURE AND METHOD FOR TESTING INTEGRATED CIRCUITS

09/929,303 | U.S. Patent Application

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