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INTEGRATED CIRCUIT, TEST STRUCTURE AND METHOD FOR TESTING INTEGRATED CIRCUITS

09/929,303 | U.S. Patent Application

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Location FILE REPOSITORY (FRANCONIA)
Filed Aug. 13, 2001
Examiner SON T DINH
Class 365
Art Group 2824
Patent No. 6,618,303
Case Type Utility - 365/201000
Status Patented Case
Child 100 39 350.0
Last Updated: 6 years, 6 months ago
Date # Transaction