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METHOD FOR TESTING SEMICONDUCTOR CHIPS

10/151,990 | U.S. Patent Application

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Location ELECTRONIC
Filed May 21, 2002
Examiner IGWE U ANYA
Class 438
Art Group 2825
Patent No. 6,858,447
Case Type Utility - 438/014000
Status Patented Case
Child 101 24 735.4
Last Updated: 6 years, 6 months ago
Date # Transaction