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METHOD FOR THE DEFECT ANALYSIS OF MEMORY MODULES

10/200,642 | U.S. Patent Application

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Location ELECTRONIC
Filed July 22, 2002
Examiner JOHN J TABONE JR
Class 714
Art Group 2138
Patent No. 7,124,336
Case Type Utility - 714/723000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child 101 34 654.9
Last Updated: 4 years, 11 months ago
Date # Transaction