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METHOD FOR TESTING INTEGRATED SEMICONDUCTOR MEMORY DEVICES

10/245,626 | U.S. Patent Application

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Location ELECTRONIC
Filed Sept. 17, 2002
Examiner HUAN HOANG
Class 365
Art Group 2818
Patent No. 6,751,140
Case Type Utility - 365/201000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child 101 45 717.0
Last Updated: 5 years ago
Date # Transaction