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TEST WAFER AND METHOD FOR PRODUCING THE TEST WAFER

10/268,203 | U.S. Patent Application

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Location ELECTRONIC
Filed Oct. 10, 2002
Examiner KHIEM D NGUYEN
Class 257
Art Group 2892
Patent No. 6,797,981
Case Type Utility - 257/048000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child 101 49 885.3
Last Updated: 5 years, 4 months ago
Date # Transaction