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CIRCUIT FOR NON-DESTRUCTIVE, SELF-NORMALIZING READING-OUT OF MRAM MEMORY CELLS

10/447,358 | U.S. Patent Application

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Location ELECTRONIC
Filed May 29, 2003
Examiner TAN NGUYEN
Class 365
Art Group 2818
Patent No. 6,747,891
Case Type Utility - 365/158000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Parent PCT/DE01/04312 -
Child 100 59 182.5
Last Updated: 4 years, 11 months ago
Date # Transaction