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TEST CIRCUIT AND METHOD FOR TESTING AN INTEGRATED MEMORY CIRCUIT

10/613,367 | U.S. Patent Application

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Location ELECTRONIC
Filed July 3, 2003
Examiner CYNTHIA H BRITT
Class 714
Art Group 2138
Patent No. 7,197,678
Case Type Utility - 714/719000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child 102 29 802.5
Last Updated: 5 years, 5 months ago
Date # Transaction