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TEST SYSTEM AND METHOD FOR TESTING MEMORY CIRCUITS

10/676,588 | U.S. Patent Application

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Location ELECTRONIC
Filed Oct. 1, 2003
Examiner NADEEM IQBAL
Class 714
Art Group 2114
Patent No. 7,162,663
Case Type Utility - 714/029000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Child 102 45 713.1
Last Updated: 5 years, 4 months ago
Date # Transaction