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IN-SITU ELECTRON BEAM INDUCED CURRENT DETECTION

10/656,754 | U.S. Patent Application

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Location ELECTRONIC
Filed Sept. 6, 2003
Examiner EMILY Y CHAN
Class 324
Art Group 2829
Patent No. 6,897,665
Case Type Utility - 324/751000
Status Patent Expired Due to NonPayment of Maintenance Fees Under 37 CFR 1.362
Last Updated: 6 years, 8 months ago
Date # Transaction