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Click below for detailed party information:

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Samsung Electronics Co., Ltd.

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SAMSUNG ELECTRONICS CO., LTD.

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Kwang Soo Kim Youngkyu Park Sungho Jang Byeonghwan Jeon

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APPARATUS FOR AND METHOD OF PERFORMING INSPECTION AND METROLOGY PROCESS

16/250,378 | U.S. Patent Application

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Location ELECTRONIC

Filed Jan. 17, 2019

Examiner MICHAEL PATRICK STAFIRA

Class 356

Art Group 2886

Patent No. 10,732,129

Case Type Utility - 356/237500

Status Patented Case

Child 10-2018-0066385

Last Updated: 3 years, 4 months ago

Date	#	Transaction
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APPARATUS FOR AND METHOD OF PERFORMING INSPECTION AND METROLOGY PROCESS

16/250,378 | U.S. Patent Application

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