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METHOD AND APPARATUS FOR TESTING EMBEDDED MEMORY IN INTEGRATED CIRCUITS

60/28,059 | U.S. Patent Application

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Location FILE REPOSITORY (FRANCONIA)
Filed Oct. 3, 1996
Status Provisional Application Expired
Child 08/917,013 Patented
Child 08/918,521 Patented
Last Updated: 4 years, 12 months ago
Date # Transaction