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YERVANT D. LEPEJIAN HRANT MARANDJIAN HOVANNES GHUKASYAN LAWRENCE KRAUS

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METHOD AND APPARATUS FOR TESTING EMBEDDED MEMORY IN INTEGRATED CIRCUITS

60/28,059 | U.S. Patent Application

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Location FILE REPOSITORY (FRANCONIA)

Filed Oct. 3, 1996

Status Provisional Application Expired

Child 08/917,013 Patented

Child 08/918,521 Patented

Last Updated: 3 years, 3 months ago

Date	#	Transaction
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METHOD AND APPARATUS FOR TESTING EMBEDDED MEMORY IN INTEGRATED CIRCUITS

60/28,059 | U.S. Patent Application

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