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Inventors

Bryan Choo Bharath Rangarajan Bhanwar Singh Carmen Morales

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FULLBRITE CAPITAL PARTNERS, LLC

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ADVANCED MICRO DEVICES, INC., Assignor

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CONCURRENT MEASUREMENT OF CRITICAL DIMENSION AND OVERLAY IN SEMICONDUCTOR MANUFACTURING

10/379,738 | U.S. Patent Application

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Location ELECTRONIC

Filed March 5, 2003

Examiner SUN J LIN

Class 716

Art Group 2825

Patent No. 7,080,330

Case Type Utility - 716/004000

Status Patented Case

Last Updated: 4 years, 9 months ago

Date	#	Transaction
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CONCURRENT MEASUREMENT OF CRITICAL DIMENSION AND OVERLAY IN SEMICONDUCTOR MANUFACTURING

10/379,738 | U.S. Patent Application

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