Filed Dec. 16, 2002

Serial No. 76475748

Registered March 6, 2007

Registration No. 3,216,102

Class Scientific, electrical, optical, monitoring and measuring instruments, namely instruments for measuring the thickness of layers of electromagnetic radiation; optical instruments for measuring the diffraction, refraction, absorption, luminescence, scattering, and reflection phenomena for the determination of layer thickness; coating thickness measurement instruments, electrical conductivity measurement instruments, micro hardness measuring instruments, porosity measuring instruments, instruments for measuring thickness of coatings, alloy composition, material analysis, porosity, electrical conductivity, ferrite content, microhardness, and other properties of coatings and layers; magneto-, opto-electronic data recording media, namely blank magnetic computer tapes and floppy discs; electromagnetic radiation detectors; spectrometers, namely x-ray fluorescence spectrometers; semiconductor detectors; color video camera; X-ray detectors; x-ray tubes for scientific laboratory-purposes; data processors; computers; measuring apparatus and instruments, namely programmable x-y stages, namely computer hardware and computer software for measuring objects; computer software for use in controlling the scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results; 021; 023; 026; 036; 038

Case Type Trademark