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79152930 | Trademark citeCite Docket

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Filed March 17, 2014
Serial No. 79152930
Registered Dec. 8, 2015
Registration No. 4,864,927
Class Laboratory apparatus and instruments, namely, electron microscopes, electron probe microanalyzers, auger electron spectrometers, photoelectron spectrometers, focused ion beam devices for analysis, milling, and surface deposition of scientific samples for laboratory research purposes, X-ray fluorescence spectrometers, nuclear magnetic resonance analyzers, electron spin resonance analyzers, mass spectrometers, electron beam lithography devices for laboratory research purposes; electric furnaces for laboratory experiments and laboratory test purposes; chromatographic apparatus for laboratory use; optical apparatus and instruments, namely, photoelectron spectrometers, optical microscopes; measuring and testing machines, namely, laboratory research analyzer for measuring, testing and analyzing scientific samples; mass spectrometers; X-ray spectrometers; auger electron spectrometers; photoelectron spectrometers; laboratory equipment, namely, spectroscopes; detectors for analyzing material, namely, X-ray detectors not for medical use, electron dispersive detectors; resonators; nuclear magnetic resonance analyzers not for medical use; electron spin resonance analyzers not for medical use; electric wires and cables; industrial X-ray machines and apparatus not for medical use; X-ray analytical apparatus not for medical use, namely, electron probe microanalyzers, X-ray fluorescence spectrometers; X-ray diffractometers not for medical use; X-ray generators not for medical use; electron microscopes; microscopes and analytical apparatus in the nature of an automated slide stainer, all utilizing electron beams not for medical use; ion sputtering apparatus and instruments, namely, focused ion beam machines for analysis, milling, and surface deposition of scientific samples for laboratory research purposes, cross section polishers, ion slicers; computers; computer programs used for analyzing and measuring material with electron microscopes, spectrometers, microanalyzers; resistance wires; electrodes for using electron microscopes; electrodes for using industrial X-ray machines and apparatus not for medical use. electrodes for focusing or deflecting charged particles; electrodes for extracting or accelerating charged particles; 021; 023; 026; 036; 038; 026; 039; 044
Design
Case Type Trademark
Status A Section 71 declaration has been accepted.
Last Updated: 3 days, 5 hours ago
Filing Date # Docket Text
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