Download Docs
Export
Print

I-PAT

87472061 | Trademark citeCite Docket

Interested in this case?

To schedule a demo, contact us at sales@docketalarm.com. Track this case, and find millions of cases like it, let us show you how.
Filed June 1, 2017
Serial No. 87472061
Registered Jan. 19, 2021
Registration No. 6,251,635
Class Computer hardware; semiconductor and wafer defect inspection systems comprised of computer software, final test data and electrical data algorithms, and inline defect and metrology computer hardware equipment; computer software for process control and yield management for the semiconductor, integrated circuit and related microelectronics manufacturing in the automotive industry; computer software for testing and inspecting physical and electrical properties of semiconductors, integrated circuits and microelectronics; computer software for use in detecting defective semiconductor electronic components; 021; 023; 026; 036; 038
I-PAT
Case Type Trademark
Status Registered. The registration date is used to determine when post-registration maintenance documents are due.
Last Updated: 3 weeks, 4 days ago
Filing Date # Docket Text
to view the full docket.