`571-272-7822
`
`
`Paper No. 8
`Entered: August 28, 2017
`
`UNITED STATES PATENT AND TRADEMARK OFFICE
`____________
`
`BEFORE THE PATENT TRIAL AND APPEAL BOARD
`____________
`
`XILINX, INC.,
`Petitioner,
`
`v.
`
`GODO KAISHA IP BRIDGE 1,
`Patent Owner.
`____________
`
`Case IPR2017-00841
`Patent 7,525,189 B2
`____________
`
`
`Before MICHAEL J. FITZPATRICK, JENNIFER MEYER CHAGNON,
`and SHEILA F. MCSHANE, Administrative Patent Judges.
`
`CHAGNON, Administrative Patent Judge.
`
`
`
`
`DECISION
`Denying Institution of Inter Partes Review
`37 C.F.R. § 42.108
`
`
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`Patent 7,525,189 B2
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`I.
`
`INTRODUCTION
`Xilinx, Inc. (“Petitioner”) filed a Petition for inter partes review of
`claims 1, 2, 4, and 5 (“the challenged claims”) of U.S. Patent No. 7,525,189
`B2 (Ex. 1001, “the ’189 patent”). Paper 1 (“Pet.”). Petitioner relies on the
`Declaration of Jianmin Qu, Ph.D. (Ex. 1002) to support its positions. Godo
`Kaisha IP Bridge 1 (“Patent Owner”) filed a Preliminary Response. Paper 7
`(“Prelim. Resp.”).
`We have authority to determine whether to institute inter partes
`review. See 35 U.S.C. § 314(b); 37 C.F.R. § 42.4(a). Upon consideration of
`the Petition and the Preliminary Response, and for the reasons explained
`below, we determine that the information presented does not show a
`reasonable likelihood that Petitioner would prevail with respect to any of the
`challenged claims. See 35 U.S.C. § 314(a). Accordingly, we do not institute
`an inter partes review of the ’189 patent.
`
`A. Related Proceedings
`The parties indicate that the ’189 patent is the subject of the following
`ongoing district court proceeding: Xilinx, Inc. v. Godo Kaisha IP Bridge 1,
`Case No. 5:17-cv-00509 (N.D. Cal.). Pet. 1; Paper 4, 1. Patent Owner also
`indicates that three petitions for inter partes review have been filed for
`related patents: Cases IPR2017-00842, IPR2017-00843, and
`IPR2017-00844. Paper 4, 1.
`
`B. The ’189 Patent
`The ’189 patent is titled “Semiconductor Device, Wiring Board, and
`Manufacturing Method Thereof,” and was filed as PCT application No.
`PCT/JP2005/009061 on May 18, 2005. Ex. 1001, at [22], [54], [86]. The
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`application entered the U.S. national stage as application No. 11/569,423
`meeting the requirements under 35 U.S.C. § 371 on November 20, 2006. Id.
`at [21], [86]. The ’189 patent claims priority to Japanese application
`No. 2004-152618, filed May 21, 2004. Id. at [30].
`The embodiments described in the ’189 patent “provide a highly
`reliable semiconductor device capable of improving the performance at a
`low cost.” Id. at 4:6–8. Figure 1 of the ’189 patent is reproduced below.
`
`
`Figure 1, above, illustrates a “partially cutaway side view schematically
`showing the first embodiment[] of a semiconductor device and wiring board
`of the present invention.” Id. at 4:14–16. As seen in Figure 1,
`semiconductor device 50 includes semiconductor chip 30 mounted on wiring
`board 20 by flip chip bonding. Id. at 4:58–62. Wiring board 20 includes
`first wiring portion 10, and second wiring portion 15 electrically connected
`to and integrated with (i.e., stacked on) first wiring portion 10. Id. at 4:63–
`5:1.
`
`First wiring portion 10 further includes a plurality of wiring layers 1
`and interlayer dielectric films 3. Id. at 5:1–4. “[E]xternal connecting
`bumps 5 are formed [on] one surface . . . of the first wiring portion.” Id. at
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`5:5–6. Second wiring portion 15 includes base 12 and connecting
`terminals 14 (each formed of a contact plug formed in a through hole)
`extending through the base. Id. at 5:9–17. In embodiments of the ’189
`patent, the “planar size of the second wiring portion 15 is equal to that of the
`first wiring portion 10.” Id. at 5:22–24.
`As further described, “the material of the base 12 of the second wiring
`portion 15 is selected so that the thermal expansion coefficient of the second
`wiring portion 15 is smaller than that of the first wiring portion 10, and equal
`to that of each semiconductor chip 30.” Id. at 5:49–52. Having the thermal
`expansion coefficient of the second wiring portion 15 be equal to that of
`each semiconductor chip 30 makes it possible to suppress the internal stress
`caused by differences in the thermal expansion coefficients. Id. at 6:1–6.
`
`C. Illustrative Claim
`Of the challenged claims, claims 1 and 4 are independent. Claims 2
`and 5 depend from claims 1 and 4, respectively. Independent claim 1 of
`the ’189 patent is reproduced below, and is illustrative of the challenged
`claims.
`
`1. A semiconductor device characterized by comprising:
`a wiring board comprising a plurality of connecting
`terminals arranged on one surface in a direction of thickness
`and a plurality of external connecting bumps arranged on the
`other surface in the direction of thickness; and
`at least one semiconductor chip connected to said
`connecting terminals,
`wherein said wiring board comprises:
`a first wiring portion comprising a plurality of wiring
`layers and said external connecting bumps; and
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`a second wiring portion electrically connected to said
`first wiring portion and integrated with said first wiring portion
`in the direction of thickness,
`said connecting terminals are made of contact plugs
`formed in through holes extending through the second wiring
`portion in the direction of thickness,
`sizes of opposing surfaces of said first wiring portion and
`said second wiring portion are equal,
`a thermal expansion coefficient of said second wiring
`portion is smaller than a thermal expansion coefficient of said
`first wiring portion and equal to a thermal expansion coefficient
`of said semiconductor chip,
`said semiconductor chip is a silicon chip,
`said second wiring portion comprises a base made of
`silicon, and
`said contact plugs are formed in said base.
`Ex. 1001, 14:49–15:8.
`
`D. The Applied References
`Petitioner relies on the following references in the asserted grounds.
`Pet. 19–20.
`
`Reference
`U.S. Patent Appl. Pub. No.
`2002/0180015 A1 (“Yamaguchi”)
`U.S. Patent No. 5,258,648 (“Lin”)
`U.S. Patent No. 6,617,681 B1
`(“Bohr”)
`
`Date
`
`Dec. 5, 2002
`
`Nov. 2, 1993
`
`Sept. 9, 2003
`
`Exhibit
`
`Ex. 1004
`
`Ex. 1005
`
`Ex. 1006
`
`
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`5
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`E. The Asserted Grounds
`Petitioner sets forth its challenges to claims 1, 2, 4, and 5 as follows.
`Pet. 19–75.
`
`References
`Yamaguchi and Lin
`Yamaguchi, Lin, and Bohr
`Yamaguchi and Lin
`(alternative theory)
`Yamaguchi, Lin, and Bohr
`(alternative theory)
`
`Basis
`§ 103
`§ 103
`
`§ 103
`
`§ 103
`
`Claims Challenged
`1, 4
`2, 5
`
`1, 41
`
`2, 5
`
`II. ANALYSIS
`A. Claim Construction
`In an inter partes review, claim terms in an unexpired patent are given
`their broadest reasonable construction in light of the specification of the
`patent in which they appear. See 37 C.F.R. § 42.100(b); Cuozzo Speed
`Techs. LLC v. Lee, 136 S. Ct. 2131, 2144–46 (2016) (upholding the use of
`the broadest reasonable interpretation standard). Under the broadest
`reasonable construction standard, claim terms generally are given their
`ordinary and customary meaning, as would be understood by one of ordinary
`skill in the art in the context of the entire disclosure. See In re Translogic
`Tech., Inc., 504 F.3d 1249, 1257 (Fed. Cir. 2007). The claims, however,
`“‘should always be read in light of the specification and teachings in the
`underlying patent,’” and “[e]ven under the broadest reasonable
`
`1 At page 20 of the Petition, this ground is listed as challenging claims 2
`and 5, however the substantive discussion beginning at page 58 of the
`Petition clearly refers to claims 1 and 4. We consider the claim listing at
`page 20 to be a typographical error.
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`interpretation, the Board’s construction ‘cannot be divorced from the
`specification and the record evidence.’” Microsoft Corp. v. Proxyconn, Inc.,
`789 F.3d 1292, 1298 (Fed. Cir. 2015) (citations omitted). Further, any
`special definition for a claim term must be set forth in the specification with
`reasonable clarity, deliberateness, and precision. See In re Paulsen, 30 F.3d
`1475, 1480 (Fed. Cir. 1994). In the absence of such a definition, however,
`limitations are not to be read from the specification into the claims. In re
`Van Geuns, 988 F.2d 1181, 1184 (Fed. Cir. 1993).
`The parties propose constructions for several claim terms. See
`Pet. 12–19; Prelim. Resp. 16–17, 23–32. Upon review of the parties’
`contentions and supporting evidence, for purposes of this Decision, we need
`address only the construction of “connecting terminals,” which we discuss
`below. See, e.g., Wellman, Inc. v. Eastman Chem. Co., 642 F.3d 1355, 1361
`(Fed. Cir. 2011) (“[C]laim terms need only be construed ‘to the extent
`necessary to resolve the controversy.’”) (quoting Vivid Techs., Inc. v. Am.
`Sci. & Eng’g, Inc., 200 F.3d 795, 803 (Fed. Cir. 1999)).
`
`“connecting terminals”
`Claim 1 recites, inter alia, “a wiring board comprising a plurality of
`connecting terminals arranged on one surface in a direction of thickness . . .
`[wherein] said connecting terminals are made of contact plugs formed in
`through holes extending through the second wiring portion in the direction
`of thickness.” Independent claim 4 includes a similar limitation.
`Petitioner does not propose a construction for the term “connecting
`terminals,” but proposes a construction for the claimed “contact plugs” that
`form the claimed “connecting terminals.” Pet. 13. According to Petitioner,
`“contact plug” means “a conductive material [that] may or may not have
`
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`land portion(s) on one or both ends.” Id. (citing Ex. 1002 ¶ 29; Ex. 1001,
`5:17–18, 9:21–24, 9:38–39, 11:43–48, Fig. 1).
`Patent Owner argues that the Petition “ignores the proper
`interpretation of ‘connecting terminals.’” Prelim. Resp. 16. Referring to the
`Specification of the ’189 patent, Patent Owner argues that “[t]he contact
`plug forms a connecting terminal of the wiring board because the wiring
`board exposes the contact plug to make it accessible to make a connection to
`another component.” Id. at 24 (emphasis added). Patent Owner provides an
`annotated version of Figure 1 (id. at 25), reproduced below.
`
`
`
`The annotated version of Figure 1, above, shows wiring board 20 connected
`to semiconductor chip 30, with a connecting terminal made of contact
`plug 14 identified by a red circle. Id. at 24. According to Patent Owner,
`“the connecting terminals connect the wiring board, via the ‘connecting
`[solder] bumps’ to a chip 30, and the number of connecting terminals on the
`wiring board equals the number of electrode terminals 25 on the chip 30.”
`Id. (citing Ex. 1001, 5:9–17, 5:34–38).
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`Patent Owner also provides an annotated version of Figure 6B (id. at
`26), reproduced below.
`
`
`
`Annotated Figure 6B, above, shows “a more detailed cross section of an
`example of a connecting terminal, which has been annotated to show the
`location of the ‘connecting bump’ in red.” Id. at 25 (citing Ex. 1001, 12:6–
`26). Figure 6B also illustrates land portion 210b that Petitioner asserts may
`or may not be included as part of the claimed “contact plug,” however,
`according to Patent Owner, the land portion “is exposed in an opening in a
`protective film to provide a location to which a connection can be made,
`which, in this case is done via the solder ball [shown in red above] attached
`to the connecting terminal.” Id. at 26 (citing Ex. 1001, 12:19–21) (emphasis
`added).
`As evidence of the ordinary meaning of the term in the art, Patent
`Owner provides The New IEEE Standard Dictionary of Electrical and
`
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`Electronics Terms,2 which defines a “terminal” in the semiconductor device
`context as “[a]n externally available point of connection to one or more
`electrodes or elements within the device.” See id. at 27 (citing Ex. 2001,
`1351) (emphasis added). Thus, according to Patent Owner, the Specification
`of the ’189 patent uses the term “terminal,” consistently with the ordinary
`meaning of the term in the art, as an “electrically conductive portion . . .
`used to connect to another device.” Id. (citing Ex. 1001, 5:9–17, 5:34–38).
`Patent Owner argues that “the broadest reasonable interpretation consistent
`with the specification of ‘connecting terminals’ requires exposed points of
`connection that allow connection, such as via a solder ball.” Id. (emphasis
`added).
`Petitioner has not presented any evidence or argument that the
`construction of “connecting terminal” should be broader than the ordinary
`meaning of the term in the art, as discussed above. See 37 C.F.R.
`§ 42.104(b)(3) (“[T]he petition must set forth . . . [h]ow the challenged claim
`is to be construed.”). We are persuaded by Patent Owner’s argument and
`evidence discussed above and, for purposes of this Decision, construe
`“connecting terminal” to require an externally available/exposed point of
`connection.
`
`B. Principles of Law
`A claim is unpatentable under 35 U.S.C. § 103(a) if the differences
`between the subject matter sought to be patented and the prior art are such
`that the subject matter as a whole would have been obvious at the time the
`invention was made to a person having ordinary skill in the art to which said
`
`2 THE NEW IEEE STANDARD DICTIONARY OF ELECTRICAL AND ELECTRONICS
`TERMS (Christopher J. Booth ed., 5th ed. 1993) (Ex. 2001).
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`subject matter pertains. See KSR Int’l Co. v. Teleflex Inc., 550 U.S. 398, 406
`(2007). The question of obviousness is resolved on the basis of underlying
`factual determinations including: (1) the scope and content of the prior art;
`(2) any differences between the claimed subject matter and the prior art;
`(3) the level of ordinary skill in the art; and (4) objective evidence of
`nonobviousness.3 Graham v. John Deere Co., 383 U.S. 1, 17–18 (1966).
`In that regard, an obviousness analysis “need not seek out precise
`teachings directed to the specific subject matter of the challenged claim, for
`a court can take account of the inferences and creative steps that a person of
`ordinary skill in the art would employ.” KSR, 550 U.S. at 418; accord In re
`Translogic Tech., Inc., 504 F.3d 1249, 1259 (Fed. Cir. 2007). A prima facie
`case of obviousness is established when the prior art, itself, would appear to
`have suggested the claimed subject matter to a person of ordinary skill in the
`art. See In re Rinehart, 531 F.2d 1048, 1051 (CCPA 1976).
`We analyze the asserted grounds of unpatentability in accordance with
`these principles.
`
`C. Level of Ordinary Skill in the Art
`Petitioner asserts that a person of ordinary skill in the art “would have
`had a Bachelor’s degree from an accredited institution in electrical
`engineering, mechanical engineering, materials science and engineering,
`physics, or the equivalent; working knowledge of semiconductor processing
`technologies for integrated circuits; and at least three years of experience in
`semiconductor processing analysis, design, and development. Graduate
`
`
`3 At this stage of the proceeding, the parties have not directed our attention
`to any objective evidence of non-obviousness.
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`education could substitute for professional experience.” Pet. 21 (citing
`Ex. 1002 ¶ 11). Patent Owner does not dispute Petitioner’s proposed level
`of ordinary skill in the art for purposes of its Preliminary Response. See
`Prelim. Resp. 15. For purposes of this Decision, we adopt Petitioner’s
`proposal regarding the level of ordinary skill in the art. The level of
`ordinary skill in the art further is reflected by the prior art of record. See
`Okajima v. Bourdeau, 261 F.3d 1350, 1355 (Fed. Cir. 2001); In re GPAC
`Inc., 57 F.3d 1573, 1579 (Fed. Cir. 1995); In re Oelrich, 579 F.2d 86, 91
`(CCPA 1978).
`
`D. The Asserted Prior Art
`
`Yamaguchi (Ex. 1004)
`Yamaguchi relates to a “multi-chip module including semiconductor
`devices and a wiring substrate for mounting the semiconductor devices.”
`Ex. 1004, at [57]. Figure 1 of Yamaguchi is reproduced below.
`
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`Figure 1, above, is a cross-sectional view of semiconductor module 1000
`according to an embodiment of Yamaguchi. Id. ¶¶ 25, 59. As seen in
`Figure 1, semiconductor devices 9 are mounted on multi-layered wiring
`substrate 6, and semiconductor module 1000 is mounted on mounting
`substrate 10. Id. ¶ 59. Multi-layered wiring substrate 6 includes substrate 1
`and multi-wiring layer 3. Id. Substrate 1 includes “through holes [100] for
`establishing electrical connection between the surface and rear face of the
`substrate.” Id. ¶ 60. Through holes 100 may be filled with conductive
`material. Id. ¶ 87.
`Multi-wiring layer 3 includes “at least one layer of thin film wiring
`layer 2,” however Yamaguchi teaches that “the number of thin film wiring
`layers 2 . . . can be set freely in accordance with the design of the
`semiconductor module.” Id. ¶¶ 60, 95; see also id. ¶ 99 (“Whether the
`multi-layered wiring layer 3 may be formed as a single layer or two or more
`layers is determined depending on the logic scale of the semiconductor
`device 9 and the layout therefor, or required high speed signal
`characteristics”). Each thin film wiring layer 2 includes wirings 120 and
`interlayer insulation layer 110. Id. ¶ 60.
`Yamaguchi further describes that because “the heat expansion
`coefficient of [substrate 1] is close to that of silicon of the semiconductor
`device 9, the stress caused by the difference of the heat expansion coefficient
`is small and connection can be ensured between the multi-layered wiring
`substrate 6 and the semiconductor device 9.” Id. ¶¶ 66, 68; see also id. ¶ 69
`(describing an embodiment in which the heat expansion coefficient of
`substrate 1 “is equal with” that of semiconductor chip 9). Yamaguchi also
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`describes relieving thermal stress between semiconductor module 1000 and
`mounting substrate 10. See id. ¶ 71.
`
`Lin (Ex. 1005)
`Lin relates to a flip chip semiconductor device. Ex. 1005, at [57].
`The semiconductor device of Lin includes interposer 22 and semiconductor
`die 12 mounted on the interposer. Id. at 4:49–53, Fig. 1. Lin further teaches
`that a preferred material for interposer 22 “is one that has a coefficient of
`thermal expansion (CTE) which closely approximates that of a
`semiconductor die” to “reduce[ the] chance that the electrical bonds . . . will
`be broken as a result of thermally induced stress.” Id. at 6:28–31, 6:40–44.
`
`Bohr (Ex. 1006)
`Bohr relates to an interposer structure for connecting an integrated
`circuit to a supporting substrate. Ex. 1006, at [57]. Bohr further teaches that
`“[v]arious circuit elements may be incorporated into the interposer,” such as
`capacitors or transistors. Id. at [57], 4:21–28.
`
`E. Asserted Obviousness Based, at Least in Part, on Yamaguchi
`and Lin (First Alternative)
`Petitioner asserts that claims 1 and 4 are unpatentable under 35 U.S.C.
`§ 103(a) as obvious in view of Yamaguchi and Lin. Pet. 22–52. Petitioner
`asserts that claims 2 and 5 are unpatentable under 35 U.S.C. § 103(a) as
`obvious in view of Yamaguchi, Lin, and Bohr. Id. at 52–57. Patent Owner
`argues that the asserted combinations do not teach or suggest several
`elements of the claims, as properly construed, and that one of skill in the art
`would not have combined the asserted references in the manner asserted in
`the Petition. Prelim. Resp. 15–55.
`
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`We have reviewed the parties’ contentions and supporting evidence.
`Given the evidence on this record, and for the reasons explained below, we
`determine that the information presented does not show a reasonable
`likelihood that Petitioner would prevail on these asserted grounds.
`
`Independent Claims 1 and 4
`Petitioner provides an annotated version of Figure 1 of Yamaguchi,
`illustrating its mapping of the structural elements of the semiconductor
`device of Yamaguchi to the claims. Pet. 23. Petitioner’s annotated Figure 1
`is reproduced below.
`
`
`Annotated Figure 1, above, shows a cross-sectional view of a semiconductor
`module of Yamaguchi, annotated by Petitioner. Illustrated in Petitioner’s
`annotated Figure 1 of Yamaguchi and discussed in the Petition in more
`detail, the following table provides a summary of Petitioner’s mapping of
`Yamaguchi to the structural elements of claim 1.
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`Claim 1
`wiring board
`plurality of connecting terminals
`(made of contact plugs formed
`in through holes)
`plurality of external connecting
`bumps
`at least one semiconductor chip
`
`first wiring portion
`
`plurality of wiring layers
`
`second wiring portion
`
`Yamaguchi
`(certain portions of) wiring substrate 6
`
`through holes 100 (filled with conductive
`material) and wirings 120 on a top surface
`
`solder bumps 7
`
`semiconductor devices 9
`(bottom) multi-layer wiring 3 and
`solder bumps 7
`wirings 120 in (bottom) multi-layer
`wiring 3
`silicon substrate 1
`
`See Pet. 22–37 (citing Ex. 1004 ¶¶ 17–19, 58–61, 66–69, 71, 75, 86, 87, 89–
`92, 95, 96, 101–106, 113–114, Figs. 1, 2; Ex. 1002 ¶¶ 29, 32, 57–60, claim
`chart at pages 42–52). Petitioner refers back to its analysis for claim 1 with
`respect to the similar limitations of claim 4. See Pet. 48–52; Ex. 1002, claim
`chart at pages 68–79.
`In relevant part, Patent Owner argues that Yamaguchi does not teach
`or suggest the claimed “connecting terminals.” Prelim. Resp. 23–32. Patent
`Owner argues that Petitioner “alleges that [the claimed ‘connecting
`terminals’] are met by conductive material that is internal to the wiring
`board, not exposed as an available point of connection, and extends along a
`portion of a conductive path but is not a terminal where the path terminates.”
`Id. at 27; see also Pet. 23 (Petitioner’s annotated version of Figure 1 of
`Yamaguchi, reproduced above, with blue arrows pointing to the alleged
`“connecting terminals”).
`
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`We agree with Patent Owner. Based on our construction of
`“connecting terminals,” discussed above in section II.A, we are not
`persuaded by Petitioner’s contention that Yamaguchi’s internal structure
`comprising through holes 100 (filled with conductive material) and wirings
`120 on a top surface of substrate 1 teach or suggest “connecting terminals,”
`as claimed. We also are persuaded by Patent Owner’s argument that
`Petitioner’s identification of “terminals” is inconsistent with the usage of
`that term in Yamaguchi itself. See Prelim. Resp. 29. Yamaguchi uses the
`term “connection terminals” to reference certain external connecting
`elements of its semiconductor device (see, e.g., Ex. 1004 ¶¶ 61, 80), but
`never refers to the internal structure relied on by Petitioner as a “terminal.”
`Petitioner relies on Lin only for its teaching of “matching a CTE of
`the entire semiconductor die 12 to a CTE of the entire interposer 22 in order
`to relieve stress,” and does not assert Lin for any teaching relevant to the
`claimed “connecting terminals.” See Pet. 46; Ex.1002, claim chart at
`page 66.
`Accordingly, for the reasons discussed, we are not persuaded that
`Petitioner has demonstrated a reasonable likelihood of showing that claims 1
`and 4 are rendered obvious by the combination of Yamaguchi and Lin, under
`its first theory, and do not institute review on this asserted ground.
`
`Dependent Claims 2 and 5
`Claims 2 and 5 depend from claims 1 and 4, respectively, and each
`recites that the semiconductor device “further compris[es] a functional
`element formed on said second wiring portion which faces said first wiring
`portion.” Petitioner relies on Bohr as disclosing this claim feature. Pet. 52–
`
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`57. Petitioner does not assert Bohr for any teaching relevant to the claimed
`“connecting terminals.” See id.
`Accordingly, for the reasons discussed above with respect to claims 1
`and 4, we are not persuaded that Petitioner has demonstrated a reasonable
`likelihood of showing that claims 2 and 5 are rendered obvious by the
`combination of Yamaguchi, Lin, and Bohr, under its first theory, and do not
`institute review on this asserted ground.
`
`F. Asserted Obviousness Based, at Least in Part, on Yamaguchi
`and Lin (Second Alternative)
`Petitioner asserts that claims 1 and 4 are unpatentable under 35 U.S.C.
`§ 103(a) as obvious in view of Yamaguchi and Lin. Pet. 58–72. Petitioner
`asserts that claims 2 and 5 are unpatentable under 35 U.S.C. § 103(a) as
`obvious in view of Yamaguchi, Lin, and Bohr. Id. at 72–75. Patent Owner
`argues that Petitioner has not provided sufficient motivation for its proposed
`modification to Yamaguchi, and that one of skill in the art would not have
`combined the asserted references in the manner asserted in the Petition.
`Prelim. Resp. 55–62.
`We have reviewed the parties’ contentions and supporting evidence.
`Given the evidence on this record, and for the reasons explained below, we
`determine that the information presented does not show a reasonable
`likelihood that Petitioner would prevail on these asserted grounds.
`
`Independent Claims 1 and 4
`Petitioner’s mapping of the semiconductor device Yamaguchi to the
`structural elements of the claims in its alternative position generally is the
`same as the mapping for its first position. See Pet. 58–72; Ex. 1002, claim
`
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`chart at pages 104–159. For its alternative position, however, Petitioner
`asserts that Yamaguchi would be modified as shown in a modified and
`annotated version of Figure 1 of Yamaguchi (Pet. 60), reproduced below.
`
`
`Petitioner’s modified and annotated version of Figure 1 of Yamaguchi,
`above, shows a cross-sectional view of a semiconductor module of
`Yamaguchi, as modified to remove top multi-wiring layer 3 (composed of
`thin film wiring layers 2) on the primary side of substrate 1. Id. According
`to Petitioner, a person of ordinary skill in the art “would be motivated to
`modify Yamaguchi based on Yamaguchi’s teaching that ‘the number of thin
`film wiring layers 2 formed on both surfaces of the insulation substrate 1 is
`optional and can be set freely in accordance with the design of the
`semiconductor module.’” Id. (quoting Ex. 1004 ¶ 95 (emphasis
`Petitioner’s); also citing Ex. 1002, claim chart at page 107). Petitioner also
`points to the teaching in Lin that “semiconductor die 12 may be bonded to
`conductive traces 26 . . . on a top surface of interposer 22 by solder bumps
`without any intervening layers between interposer 22 and semiconductor
`die 12.” Id. at 59–60 (citing Ex. 1005, 4:52–62, Fig. 4; Ex. 1002, claim
`chart at page 105).
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`Patent Owner argues that “there is no supportable rationale” for
`Petitioner’s proposed modification to Yamaguchi. Prelim. Resp. 56; see id.
`at 56–61. First, Patent Owner argues “the Petition misinterprets
`Yamaguchi” (id. at 57). In this regard, Patent Owner argues that, while
`Yamaguchi teaches that the number of thin film wiring layers 2 in
`multi-wiring layer 3 may vary depending on how many connections are
`necessary in the device, there is no suggestion or teaching in Yamaguchi that
`they can be eliminated entirely as Petitioner asserts. Id. at 57–58 (citing
`Ex. 1004 ¶¶ 9, 72, 73, 97–99). Second, Patent Owner argues that the wiring
`layers on top of the substrate in Yamaguchi “perform a critical function in
`Yamaguchi and a [person of ordinary skill in the art] would not have
`eliminated them.” Id. at 59. For example, Yamaguchi teaches that the
`wiring layers provide “signal wirings between the semiconductor devices 9
`to each other.” Ex. 1004 ¶ 97; Prelim. Resp. 59. According to Patent
`Owner, Petitioner “does not explain how communications between chips 9
`would occur if wiring layers that include the ‘signal wirings’ for those
`communications were eliminated.” Prelim. Resp. 60. Patent Owner further
`argues that “the Petition’s modification is motivated by nothing but [an]
`attempt to reconstruct the claims in hindsight.” Id. at 60–61.
`Based on the record before us, we agree with Patent Owner.
`Yamaguchi expressly states that “multi-wiring layer 3 comprises at least one
`layer of thin film wiring layer 2,” and “[w]hether the multi-layered wiring
`layer 3 may be formed as a single layer or two or more layers is determined
`depending on the logic scale of the semiconductor device 9 and the layout
`therefor, or required high speed signal characteristics.” Ex. 1004 ¶¶ 60, 99
`(emphases added). We discern no suggestion in Yamaguchi to remove
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`entirely the top multi-wiring layer, and are not persuaded by Dr. Qu’s
`conclusory statement that a “[person of ordinary skill in the art] reading
`Yamaguchi in view of Lin would have understood the thin film wiring
`layers 2 over substrate 1 are optional and can be removed as a matter of
`design choice.” Ex. 1002, claim chart at page 107; see also 37 C.F.R.
`§ 42.65(a) (“Expert testimony that does not disclose the underlying facts or
`data on which the opinion is based is entitled to little or no weight.”). For
`the reasons discussed, we are not persuaded that a person of ordinary skill in
`the art would have been motivated to remove top multi-wiring layer 3 on the
`primary side of substrate 1 of Yamaguchi. Petitioner’s assertions for its
`alternative theory of obviousness in view of Yamaguchi and Lin are
`premised on this modification.
`Accordingly, we are not persuaded that Petitioner has demonstrated a
`reasonable likelihood of showing that claims 1 and 4 are rendered obvious
`by the combination of Yamaguchi and Lin, under its second theory, and do
`not institute review on this asserted ground.
`
`Dependent Claims 2 and 5
`Petitioner again relies on Bohr as disclosing the additional feature of
`dependent claims 2 and 5. Pet. 73–75. For the reasons discussed above with
`respect to claims 1 and 4, we are not persuaded that Petitioner has
`demonstrated a reasonable likelihood of showing that claims 2 and 5 are
`rendered obvious by the combination of Yamaguchi, Lin, and Bohr, under
`its second theory, and do not institute review on this asserted ground.
`
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`III. CONCLUSION
`As discussed above, we do not institute an inter partes review of any
`claim of the ’189 patent.
`
`IV. ORDER
`Accordingly, it is
`ORDERED that pursuant to 35 U.S.C. § 314(a), no inter partes
`review is instituted as to any claim of U.S. Patent No. 7,525,189 B2.
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`PETITIONER:
`Steven H. Slater
`Roger C. Knapp
`Lizabeth Vice
`SLATER MATSIL, LLP
`sslater@slatermatsil.com
`rknapp@slatermatsil.com
`lvice@slatermatsil.com
`
`
`PATENT OWNER:
`Edmund J. Walsh
`Gerald B. Hrycyszyn
`Richard F. Giunta
`Elisabeth H. Hunt
`WOLF, GREENFIELD & SACKS, P.C.
`EWalsh-PTAB@wolfgreenfield.com
`GHrycyszyn-PTAB@wolfgreenfield.com
`RGiunta-PTAB@wolfgreenfield.com
`EHunt-PTAB@wolfgreenfield.com
`
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