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Displaying 39-53 of
66 results
1021 Exhibit: Ex 1021 Horiguchi, Nanoscale Memory Repair
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IPR2016-01567, No. 1021-21 Exhibit - Ex 1021 Horiguchi, Nanoscale Memory Repair (P.T.A.B. Aug. 12, 2016)
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1011 Exhibit: Ex 1011 IPR2016 00094, Decision Denying Institution filed Apr 12, 20...
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IPR2016-01567, No. 1011-11 Exhibit - Ex 1011 IPR2016 00094, Decision Denying Institution filed Apr 12, 2016 (P.T.A.B. Aug. 12, 2016)
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1014 Exhibit: Ex 1014 US Pat 5,267,214
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IPR2016-01567, No. 1014-14 Exhibit - Ex 1014 US Pat 5,267,214 (P.T.A.B. Aug. 12, 2016)
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1022 Exhibit: Ex 1022 Smith, Laser Programmable Redundancy and Yield Improve...
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IPR2016-01567, No. 1022-22 Exhibit - Ex 1022 Smith, Laser Programmable Redundancy and Yield Improvement (P.T.A.B. Aug. 12, 2016)
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1012 Exhibit: Ex 1012 US Pat 5,956,285
Document
IPR2016-01567, No. 1012-12 Exhibit - Ex 1012 US Pat 5,956,285 (P.T.A.B. Aug. 12, 2016)
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1018 Exhibit: Ex 1018 US Pat 5,798,974
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IPR2016-01567, No. 1018-18 Exhibit - Ex 1018 US Pat 5,798,974 (P.T.A.B. Aug. 12, 2016)
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1003 Exhibit: Ex 1003 US Pat 5,894,441
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IPR2016-01567, No. 1003-3 Exhibit - Ex 1003 US Pat 5,894,441 (P.T.A.B. Aug. 12, 2016)
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1010 Exhibit: Ex 1010 IPR2016 00094, Patent Owners Preliminary Response
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IPR2016-01567, No. 1010-10 Exhibit - Ex 1010 IPR2016 00094, Patent Owners Preliminary Response (P.T.A.B. Aug. 12, 2016)
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1004 Exhibit: Ex 1004 File History for US Pat 5,894,441
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IPR2016-01567, No. 1004-4 Exhibit - Ex 1004 File History for US Pat 5,894,441 (P.T.A.B. Aug. 12, 2016)
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1019 Exhibit: Ex 1019 US Pat 5,808,948
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IPR2016-01567, No. 1019-19 Exhibit - Ex 1019 US Pat 5,808,948 (P.T.A.B. Aug. 12, 2016)
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1007 Exhibit: Ex 1007 IPR2016 00094, Petition for IPR Filed Oct 10, 2015
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IPR2016-01567, No. 1007-7 Exhibit - Ex 1007 IPR2016 00094, Petition for IPR Filed Oct 10, 2015 (P.T.A.B. Aug. 12, 2016)
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1016 Exhibit: Ex 1016 US Pat 5,355,339
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IPR2016-01567, No. 1016-16 Exhibit - Ex 1016 US Pat 5,355,339 (P.T.A.B. Aug. 12, 2016)
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1009 Exhibit: Ex 1009 Japanese Patent Appl No H06 052696 to Minami
Document
IPR2016-01567, No. 1009-9 Exhibit - Ex 1009 Japanese Patent Appl No H06 052696 to Minami (P.T.A.B. Aug. 12, 2016)
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1020 Exhibit: Ex 1020 Horiguchi, Redundancy Techniques for High Density DRAMs
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IPR2016-01567, No. 1020-20 Exhibit - Ex 1020 Horiguchi, Redundancy Techniques for High Density DRAMs (P.T.A.B. Aug. 12, 2016)
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1005 Exhibit: Ex 1005 US Pat 5,265,055
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IPR2016-01567, No. 1005-5 Exhibit - Ex 1005 US Pat 5,265,055 (P.T.A.B. Aug. 12, 2016)
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