Document
IPR2017-01417, No. 2003-23 Exhibit - Ron Maltiel CV (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2003-23 Exhibit - Ron Maltiel CV (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2004-24 Exhibit - Deposition Transcript of Gary Rubloff, PhD March 9, 2018 (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2004-24 Exhibit - Deposition Transcript of Gary Rubloff, PhD March 9, 2018 (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2010-30 Exhibit - Ito, Mechanical Stress Effect of Etch Stop Nitride and its Impact on Deep Submicron Transistor Design (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2010-30 Exhibit - Ito, Mechanical Stress Effect of Etch Stop Nitride and its Impact on Deep Submicron Transistor Design (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2002-22 Exhibit - Declaration of Ron Maltiel in Support of Patent Owners Response to Petition (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2002-22 Exhibit - Declaration of Ron Maltiel in Support of Patent Owners Response to Petition (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2005-25 Exhibit - US 6,441,418 Shields (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2005-25 Exhibit - US 6,441,418 Shields (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2008-28 Exhibit - Silicon Nitride Si3N4 Material Properties (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2008-28 Exhibit - Silicon Nitride Si3N4 Material Properties (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2004 Exhibit - Deposition Transcript of Gary Rubloff, PhD March 9, 2018 (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2004 Exhibit - Deposition Transcript of Gary Rubloff, PhD March 9, 2018 (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2009 Exhibit - Comprehensive Dictionary of Electrical Engineering, 2nd Ed (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2009 Exhibit - Comprehensive Dictionary of Electrical Engineering, 2nd Ed (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2010 Exhibit - Ito, Mechanical Stress Effect of Etch Stop Nitride and its Impact on Deep Submicron Transistor Design (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2010 Exhibit - Ito, Mechanical Stress Effect of Etch Stop Nitride and its Impact on Deep Submicron Transistor Design (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2003 Exhibit - Ron Maltiel CV (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2003 Exhibit - Ron Maltiel CV (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2007 Exhibit - Silicon Dioxide SiO2 and Silicon Nitride Si3N4 Properties (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2007 Exhibit - Silicon Dioxide SiO2 and Silicon Nitride Si3N4 Properties (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2002 Exhibit - Declaration of Ron Maltiel in Support of Patent Owners Response to Petition (P.T.A.B. Mar. 29, 2018)
Cite Document
IPR2017-01417, No. 2002 Exhibit - Declaration of Ron Maltiel in Support of Patent Owners Response to Petition (P.T.A.B. Mar. 29, 2018)
+ More Snippets
Document
IPR2017-01417, No. 2001-21 Exhibit - Declaration of Michael C Ting In Support of Patent Owners Motion for Pro Hac Vice Admission (P.T.A.B. Feb. 2, 2018)
Cite Document
IPR2017-01417, No. 2001-21 Exhibit - Declaration of Michael C Ting In Support of Patent Owners Motion for Pro Hac Vice Admission (P.T.A.B. Feb. 2, 2018)
+ More Snippets
Document
IPR2017-01417, No. 1020-15 Exhibit - Exhibit 1020 (P.T.A.B. May. 12, 2017)
Cite Document
IPR2017-01417, No. 1020-15 Exhibit - Exhibit 1020 (P.T.A.B. May. 12, 2017)
+ More Snippets
Document
IPR2017-01417, No. 1008-7 Exhibit - Exhibit 1008 (P.T.A.B. May. 12, 2017)
Cite Document
IPR2017-01417, No. 1008-7 Exhibit - Exhibit 1008 (P.T.A.B. May. 12, 2017)
+ More Snippets